A new low energy BIST using a statistical code

Sunghoon Chun, Taejin Kim, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

To tackle with the increased switching activity during the test operation, this paper proposes a new built-in self test (BIST) scheme for low energy testing that uses a statistical code and a new technique to skip unnecessary test sequences. From a general point of view, the goal of this technique is to minimize the total power consumption during a test and to allow the at-speed test in order to achieve high fault coverage. The effectiveness of the proposed low energy BIST scheme was validated on a set of ISCAS '89 benchmark circuits with respect to test data volume and energy saving.

Original languageEnglish
Title of host publication2008 Asia and South Pacific Design Automation Conference, ASP-DAC
Pages647-652
Number of pages6
DOIs
Publication statusPublished - 2008 Aug 21
Event2008 Asia and South Pacific Design Automation Conference, ASP-DAC - Seoul, Korea, Republic of
Duration: 2008 Mar 212008 Mar 24

Other

Other2008 Asia and South Pacific Design Automation Conference, ASP-DAC
CountryKorea, Republic of
CitySeoul
Period08/3/2108/3/24

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All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Cite this

Chun, S., Kim, T., & Kang, S. (2008). A new low energy BIST using a statistical code. In 2008 Asia and South Pacific Design Automation Conference, ASP-DAC (pp. 647-652). [4484031] https://doi.org/10.1109/ASPDAC.2008.4484031