A New Maximal Diagnosis Algorithm for Bus-structured Systems

Yong Joon Kim, Dong Sub Song, Yong Seung Shin, Sunghoon Chun, Sungho Kang

Research output: Contribution to journalConference article

Abstract

Complex interconnects in highly integrated system chips are implemented with the bus structures. From a testing point of view, bus-structured systems require more complicated consideration than simple wiring networks since a bus line receives data from many drivers. Therefore, some faults are detected all the time and others are detected only at a particular time. We propose a new interconnect test algorithm for bus structures. The MD+ algorithm supports maximal diagnosis for the bus-structured system and its test period is shorter than the previous algorithms. Moreover, the MD+ algorithm is easy to apply since it is based on a complete diagnosis algorithm for wiring networks. The effectiveness of the MD+ algorithm is confirmed by comparing the test length with previous bus-based interconnect test algorithms.

Original languageEnglish
Pages (from-to)349-357
Number of pages9
JournalIEEE International Test Conference (TC)
Publication statusPublished - 2003 Nov 6
EventProceedings International Test Conference 2003 - Charlotte, NC, United States
Duration: 2003 Sep 302003 Oct 2

Fingerprint

Interconnect
Electric wiring
Integrated System
Driver
Fault
Chip
Testing
Line

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Kim, Yong Joon ; Song, Dong Sub ; Shin, Yong Seung ; Chun, Sunghoon ; Kang, Sungho. / A New Maximal Diagnosis Algorithm for Bus-structured Systems. In: IEEE International Test Conference (TC). 2003 ; pp. 349-357.
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A New Maximal Diagnosis Algorithm for Bus-structured Systems. / Kim, Yong Joon; Song, Dong Sub; Shin, Yong Seung; Chun, Sunghoon; Kang, Sungho.

In: IEEE International Test Conference (TC), 06.11.2003, p. 349-357.

Research output: Contribution to journalConference article

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