A new online test and debug methodology for automotive camera image processing system

Hyunggoy Oh, Inhyuk Choi, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Since the automotive camera image processing system is highly related to the people's lives, the online test and debug method for the system is required to monitor the system in real-time and increase the reliability. However, there are errors and faults which escaped from the pre-silicon verification and the manufacturing test and they cause the test and debug time longer. Because the excessive time overhead has a bad influence upon the reliability, it is necessary to reduce the time overhead. To overcome this challenge, a new online test and debug methodology for the automotive camera image processing system is proposed in this paper. Experimental results show how the proposed methodology can reduce the time overhead significantly on various cases compared to the previous work.

Original languageEnglish
Title of host publication2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages370-371
Number of pages2
ISBN (Electronic)9781509015702
DOIs
Publication statusPublished - 2017 Jan 3
Event2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016 - Jeju, Korea, Republic of
Duration: 2016 Oct 252016 Oct 28

Publication series

Name2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016

Other

Other2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016
CountryKorea, Republic of
CityJeju
Period16/10/2516/10/28

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Signal Processing

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    Oh, H., Choi, I., & Kang, S. (2017). A new online test and debug methodology for automotive camera image processing system. In 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016 (pp. 370-371). [7803978] (2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APCCAS.2016.7803978