A new redundancy analysis algorithm using one side pivot

Jooyoung Kim, Keewon Cho, Woosung Lee, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

It is important to test the memory and repair faults for improving the memory yield. Many redundancy analysis (RA) algorithms have been developed to repair the memory faults. However, it is difficult to achieve high repair rate and fast analysis speed. The previous RA algorithms do not achieve both high repair rate and fast analysis speed. To overcome this problem, a new RA algorithm called one side pivot (OSP) is proposed. Using the property of pivot fault and its repair priority, the analysis time to find a solution can be reduced. The experimental results show that the proposed algorithm is efficient in terms of repair rate and analysis speed.

Original languageEnglish
Title of host publicationISOCC 2014 - International SoC Design Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages134-135
Number of pages2
ISBN (Electronic)9781479951260
DOIs
Publication statusPublished - 2015 Apr 16
Event11th International SoC Design Conference, ISOCC 2014 - Jeju, Korea, Republic of
Duration: 2014 Nov 32014 Nov 6

Publication series

NameISOCC 2014 - International SoC Design Conference

Other

Other11th International SoC Design Conference, ISOCC 2014
CountryKorea, Republic of
CityJeju
Period14/11/314/11/6

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

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