A new scan chain reordering method for low power consumption based on care bit density

Kyunghwan Cho; Jihye Kim; Hyunggoy Oh; Sangjun Lee; Sungho Kang

doi:10.1109/ISOCC47750.2019.9078527

A new scan chain reordering method for low power consumption based on care bit density

Kyunghwan Cho, Jihye Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

Scan-based testing, though widely used in modern digital designs, causes more power consumption than in functional mode. This excessive power consumption can cause severe hazards such as circuit reliability and yield loss. To solve this problem, a new scan chain reordering method based on care bit density is proposed in this paper. This proposed method helps merging care bits toward the front end of scan chains. Thus, it can reduce scan cell switching activities during scan shift operation. Experimental results on ISCAS'89 benchmark circuits show that the proposed scan chain reordering method reduces test power consumption compared to the previous work.

Original language	English
Title of host publication	Proceedings - 2019 International SoC Design Conference, ISOCC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	134-135
Number of pages	2
ISBN (Electronic)	9781728124780
DOIs	https://doi.org/10.1109/ISOCC47750.2019.9078527
Publication status	Published - 2019 Oct 1
Event	16th International System-on-Chip Design Conference, ISOCC 2019 - Jeju, Korea, Republic of Duration: 2019 Oct 6 → 2019 Oct 9

Publication series

Name	Proceedings - 2019 International SoC Design Conference, ISOCC 2019
Volume	2019-January

Conference

Conference	16th International System-on-Chip Design Conference, ISOCC 2019
Country/Territory	Korea, Republic of
City	Jeju
Period	19/10/6 → 19/10/9

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported by the IT R&D program of MOTIE/KEIT. [10052716, Design technology development of ultra-low voltage operating circuit and IP for smart sensor SoC].

Funding Information:
This work was supported by the IT R&D program of MOTIE/KEIT. [10052716, Design technology development of ultra-low voltage operating circuit and IP for smart sensor SoC].

Publisher Copyright:
© 2019 IEEE.

All Science Journal Classification (ASJC) codes

Signal Processing
Electrical and Electronic Engineering
Instrumentation
Artificial Intelligence
Hardware and Architecture

Access to Document

10.1109/ISOCC47750.2019.9078527

Cite this

Cho, K., Kim, J., Oh, H., Lee, S., & Kang, S. (2019). A new scan chain reordering method for low power consumption based on care bit density. In Proceedings - 2019 International SoC Design Conference, ISOCC 2019 (pp. 134-135). [9078527] (Proceedings - 2019 International SoC Design Conference, ISOCC 2019; Vol. 2019-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC47750.2019.9078527

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abstract = "Scan-based testing, though widely used in modern digital designs, causes more power consumption than in functional mode. This excessive power consumption can cause severe hazards such as circuit reliability and yield loss. To solve this problem, a new scan chain reordering method based on care bit density is proposed in this paper. This proposed method helps merging care bits toward the front end of scan chains. Thus, it can reduce scan cell switching activities during scan shift operation. Experimental results on ISCAS'89 benchmark circuits show that the proposed scan chain reordering method reduces test power consumption compared to the previous work.",

author = "Kyunghwan Cho and Jihye Kim and Hyunggoy Oh and Sangjun Lee and Sungho Kang",

note = "Funding Information: ACKNOWLEDGMENT This work was supported by the IT R&D program of MOTIE/KEIT. [10052716, Design technology development of ultra-low voltage operating circuit and IP for smart sensor SoC]. Funding Information: This work was supported by the IT R&D program of MOTIE/KEIT. [10052716, Design technology development of ultra-low voltage operating circuit and IP for smart sensor SoC]. Publisher Copyright: {\textcopyright} 2019 IEEE.; 16th International System-on-Chip Design Conference, ISOCC 2019 ; Conference date: 06-10-2019 Through 09-10-2019",

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Cho, K, Kim, J, Oh, H, Lee, S & Kang, S 2019, A new scan chain reordering method for low power consumption based on care bit density. in Proceedings - 2019 International SoC Design Conference, ISOCC 2019., 9078527, Proceedings - 2019 International SoC Design Conference, ISOCC 2019, vol. 2019-January, Institute of Electrical and Electronics Engineers Inc., pp. 134-135, 16th International System-on-Chip Design Conference, ISOCC 2019, Jeju, Korea, Republic of, 19/10/6. https://doi.org/10.1109/ISOCC47750.2019.9078527

A new scan chain reordering method for low power consumption based on care bit density. / Cho, Kyunghwan; Kim, Jihye; Oh, Hyunggoy et al.

Proceedings - 2019 International SoC Design Conference, ISOCC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 134-135 9078527 (Proceedings - 2019 International SoC Design Conference, ISOCC 2019; Vol. 2019-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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N1 - Funding Information: ACKNOWLEDGMENT This work was supported by the IT R&D program of MOTIE/KEIT. [10052716, Design technology development of ultra-low voltage operating circuit and IP for smart sensor SoC]. Funding Information: This work was supported by the IT R&D program of MOTIE/KEIT. [10052716, Design technology development of ultra-low voltage operating circuit and IP for smart sensor SoC]. Publisher Copyright: © 2019 IEEE.

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AB - Scan-based testing, though widely used in modern digital designs, causes more power consumption than in functional mode. This excessive power consumption can cause severe hazards such as circuit reliability and yield loss. To solve this problem, a new scan chain reordering method based on care bit density is proposed in this paper. This proposed method helps merging care bits toward the front end of scan chains. Thus, it can reduce scan cell switching activities during scan shift operation. Experimental results on ISCAS'89 benchmark circuits show that the proposed scan chain reordering method reduces test power consumption compared to the previous work.

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Cho K, Kim J, Oh H, Lee S, Kang S. A new scan chain reordering method for low power consumption based on care bit density. In Proceedings - 2019 International SoC Design Conference, ISOCC 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 134-135. 9078527. (Proceedings - 2019 International SoC Design Conference, ISOCC 2019). doi: 10.1109/ISOCC47750.2019.9078527

A new scan chain reordering method for low power consumption based on care bit density

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