A new scan slice encoding scheme with flexible code for test data compression

Keun Soo Lee, Hyuntae Park, Hyeonuk Son, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

As the design for testability (DFT) is essential in the semiconductor manufacturing, the scan-based architecture is widely used to decrease the test complexity of a chip. However, the scan-based architecture requires high test cost such as the test data volume and the test time. In order to alleviate the test cost problem of the scan-based architecture, a lot of test data compression schemes using the scan slice encoding have been presented. In this paper, we propose a new scan slice encoding scheme with flexible code for test data compression. The proposed scheme fully utilizes the flexible code as the control code or the data code. The flexible code provides supplementary encoding mode without additional control code. As a result, the test cost is significantly reduced by the various encoding mode with low test equipment pin overhead. The experiment results based on ISCAS'89 benchmark circuits show that the test data volume and the test time is reduced up to 82% compared with the original data.

Original languageEnglish
Title of host publication2010 International SoC Design Conference, ISOCC 2010
Pages217-220
Number of pages4
DOIs
Publication statusPublished - 2010 Dec 1
Event2010 International SoC Design Conference, ISOCC 2010 - Incheon, Korea, Republic of
Duration: 2010 Nov 222010 Nov 23

Publication series

Name2010 International SoC Design Conference, ISOCC 2010

Other

Other2010 International SoC Design Conference, ISOCC 2010
CountryKorea, Republic of
CityIncheon
Period10/11/2210/11/23

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All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

Cite this

Lee, K. S., Park, H., Son, H., & Kang, S. (2010). A new scan slice encoding scheme with flexible code for test data compression. In 2010 International SoC Design Conference, ISOCC 2010 (pp. 217-220). [5682934] (2010 International SoC Design Conference, ISOCC 2010). https://doi.org/10.1109/SOCDC.2010.5682934