A new wafer level latent defect screening methodology for highly reliable DRAM using a response surface method

Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Mathematics

Engineering & Materials Science