A novel BIRA method with high repair efficiency and small hardware overhead

Myung Hoon Yang, Hyungjun Cho, Woosik Jeong, Sungho Kang

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Built-in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. In this letter, a new BIRA method for both high repair efficiency and small hardware overhead is presented. The proposed method performs redundancy analysis operations using the spare mapping registers with a covered fault list. Experimental results demonstrate the superiority of the proposed method compared to previous works.

Original languageEnglish
Pages (from-to)339-341
Number of pages3
JournalETRI Journal
Volume31
Issue number3
DOIs
Publication statusPublished - 2009 Jun

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Electrical and Electronic Engineering

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