A novel BIRA method with high repair efficiency and small hardware overhead

Myung Hoon Yang; Hyungjun Cho; Woosik Jeong; Sungho Kang

doi:10.4218/etrij.09.0209.0024

A novel BIRA method with high repair efficiency and small hardware overhead

Myung Hoon Yang, Hyungjun Cho, Woosik Jeong, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Built-in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. In this letter, a new BIRA method for both high repair efficiency and small hardware overhead is presented. The proposed method performs redundancy analysis operations using the spare mapping registers with a covered fault list. Experimental results demonstrate the superiority of the proposed method compared to previous works.

Original language	English
Pages (from-to)	339-341
Number of pages	3
Journal	ETRI Journal
Volume	31
Issue number	3
DOIs	https://doi.org/10.4218/etrij.09.0209.0024
Publication status	Published - 2009 Jun

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Computer Science(all)
Electrical and Electronic Engineering

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AB - Built-in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. In this letter, a new BIRA method for both high repair efficiency and small hardware overhead is presented. The proposed method performs redundancy analysis operations using the spare mapping registers with a covered fault list. Experimental results demonstrate the superiority of the proposed method compared to previous works.

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A novel BIRA method with high repair efficiency and small hardware overhead

Abstract

All Science Journal Classification (ASJC) codes

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