A novel CPW structure for high-speed interconnects

S. J. Yoon, S. H. Jeong, J. G. Yook, Y. J. Kim, S. G. Lee, O. K. Seo, K. S. Lim, D. S. Kim

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

For high-speed digital circuits a novel elevated-CPW (ECPW) structure with low loss and low dispersion is proposed and the performances are well compared with the theoretical prediction. The ECPW is designed with the aid of time domain fullwave FDTD technique and is fabricated using conventional thick-film MEMS processing. Proposed structure reveal at least 10dB lower insertion loss compared to conventional CPW geometries and effective permittivity is 4 to 6 times smaller than that of conventional CPW. Characteristic impedances and effective permittivities are given for various geometrical parameters.

Original languageEnglish
Pages (from-to)771-774
Number of pages4
JournalIEEE MTT-S International Microwave Symposium Digest
Volume2
DOIs
Publication statusPublished - 2001

All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'A novel CPW structure for high-speed interconnects'. Together they form a unique fingerprint.

Cite this