A novel X-filling method for capture power reduction

Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This paper proposes a X-filling method that reduces capture power during scan-based testing. The proposed method classifies scan cells for dividing the scan cells into some groups. Then, based on the divided groups, X-bits are filled simultaneously to reduce the computation time. Since the proposed method uses a novel grouping algorithm and fills X-bits based on groups, the proposed method reduces switching activity and computation time when compared with conventional X-filling methods. The simulation results show that the proposed method reduces the switching activity up to 70% and the number of simulations for the X-filling up to 52% compared with that of conventional X-filling methods.

Original languageEnglish
Article number20171093
Journalieice electronics express
Volume14
Issue number23
DOIs
Publication statusPublished - 2017

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A novel X-filling method for capture power reduction'. Together they form a unique fingerprint.

  • Cite this