A novel X-filling method for capture power reduction

Heetae Kim; Hyunggoy Oh; Jaeil Lim; Sungho Kang

doi:10.1587/elex.14.20171093

A novel X-filling method for capture power reduction

Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

This paper proposes a X-filling method that reduces capture power during scan-based testing. The proposed method classifies scan cells for dividing the scan cells into some groups. Then, based on the divided groups, X-bits are filled simultaneously to reduce the computation time. Since the proposed method uses a novel grouping algorithm and fills X-bits based on groups, the proposed method reduces switching activity and computation time when compared with conventional X-filling methods. The simulation results show that the proposed method reduces the switching activity up to 70% and the number of simulations for the X-filling up to 52% compared with that of conventional X-filling methods.

Original language	English
Article number	20171093
Journal	ieice electronics express
Volume	14
Issue number	23
DOIs	https://doi.org/10.1587/elex.14.20171093
Publication status	Published - 2017

Bibliographical note

Funding Information:
This work was supported by the IT R&D program of MOTIE/KEIT. [10052716, Design technology development of ultra-low voltage operating circuit and IP for smart sensor SoC].

Publisher Copyright:
© IEICE 2017.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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abstract = "This paper proposes a X-filling method that reduces capture power during scan-based testing. The proposed method classifies scan cells for dividing the scan cells into some groups. Then, based on the divided groups, X-bits are filled simultaneously to reduce the computation time. Since the proposed method uses a novel grouping algorithm and fills X-bits based on groups, the proposed method reduces switching activity and computation time when compared with conventional X-filling methods. The simulation results show that the proposed method reduces the switching activity up to 70% and the number of simulations for the X-filling up to 52% compared with that of conventional X-filling methods.",

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AB - This paper proposes a X-filling method that reduces capture power during scan-based testing. The proposed method classifies scan cells for dividing the scan cells into some groups. Then, based on the divided groups, X-bits are filled simultaneously to reduce the computation time. Since the proposed method uses a novel grouping algorithm and fills X-bits based on groups, the proposed method reduces switching activity and computation time when compared with conventional X-filling methods. The simulation results show that the proposed method reduces the switching activity up to 70% and the number of simulations for the X-filling up to 52% compared with that of conventional X-filling methods.

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A novel X-filling method for capture power reduction

Abstract

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