Most superconducting devices are designed for a fixed operating temperature range, however, temperature varia- tions are inevitable in some situations. For example, the temperature of a resistive-type superconducting fault current limiter becomes higher during fault cycle operation. Therefore, knowledge of the temperature dependence of the current-to-voltage characteristic is necessary for accurate simulation or design processes. This paper explores the temperature dependence of the n-index, which describes sharpness of superconductivity to normal transition, using a second-generation high-temperature superconducting tape sample under a liquid nitrogen surrounded environment. The voltage across the sample according to given current and temperature is measured by establishing a measurement system with a protection system. The average of the data from multiple measurements is calculated and compared with three different n-index models. Constant, inversely proportional, and modified inversely proportional models are analyzed. The modified inversely proportional model showed the least error when compared to the measurement data.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering