A prevenient voltage stress test method for high density memory

Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

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Engineering & Materials Science