A selective scan chain activation technique for minimizing average and peak power consumption

Yongjoon Kim, Jaeseok Park, Sungho Kang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In this paper we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed method constantly reduces the average and peak power consumption during scan testing.

Original languageEnglish
Pages (from-to)193-196
Number of pages4
JournalIEICE Transactions on Information and Systems
VolumeE93-D
Issue number1
DOIs
Publication statusPublished - 2010

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence

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