In this paper we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed method constantly reduces the average and peak power consumption during scan testing.
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Computer Vision and Pattern Recognition
- Electrical and Electronic Engineering
- Artificial Intelligence