A simple reflection-type two-dimensional refractive index profile measurement technique for optical waveguides

Youngchun Youk, Dug Young Kim

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

We report a new configuration of a reflection-type confocal scanning optical microscope system for measuring the refractive index profile of an optical waveguide. Several improvements on the earlier design are proposed; a light emitting diode at 650 nm wavelength instead of a laser diode or He-Ne laser is used as a light source for better index precision, and a simple longitudinal linear scanning and a curve fitting techniques are adapted instead of a servo control for maintaining an optical confocal arrangement. We have obtained spatial resolution of 800 nm and an index precision of 2 × 10-4. To verify the system's capability, the refractive index profiles of a conventional multimode fiber and a home-made four-mode fiber were examined with our proposed measurement method.

Original languageEnglish
Pages (from-to)206-210
Number of pages5
JournalOptics Communications
Volume262
Issue number2
DOIs
Publication statusPublished - 2006 Jun 15

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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