A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain

Hyeonchan Lim, Seokjun Jang, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a simulation-based scan chain diagnosis algorithm for double faults in a scan chain. With an ordinary flush test pattern, only the last fault can be observed while the others are masked by the last fault. Considering the multiple faults, the forward fault and the rearward fault are decided by analyzing signatures of a faulty chain and good chains, separately. The results of analysis are upper bound (rearward fault) and lower bound (forward fault). If only one fault exists, there is only a candidate in the boundary. The proposed technique can be applied for both stuck-at and transition faults. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the diagnosis resolution is increased compared to the conventional method.

Original languageEnglish
Title of host publicationProceedings - International SoC Design Conference 2018, ISOCC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages265-266
Number of pages2
ISBN (Electronic)9781538679609
DOIs
Publication statusPublished - 2019 Feb 22
Event15th International SoC Design Conference, ISOCC 2018 - Daegu, Korea, Republic of
Duration: 2018 Nov 122018 Nov 15

Publication series

NameProceedings - International SoC Design Conference 2018, ISOCC 2018

Conference

Conference15th International SoC Design Conference, ISOCC 2018
CountryKorea, Republic of
CityDaegu
Period18/11/1218/11/15

Fingerprint

Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Lim, H., Jang, S., & Kang, S. (2019). A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. In Proceedings - International SoC Design Conference 2018, ISOCC 2018 (pp. 265-266). [8649930] (Proceedings - International SoC Design Conference 2018, ISOCC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2018.8649930
Lim, Hyeonchan ; Jang, Seokjun ; Kang, Sungho. / A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 265-266 (Proceedings - International SoC Design Conference 2018, ISOCC 2018).
@inproceedings{5a98a32992aa4239b1df282c285bc7e8,
title = "A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain",
abstract = "This paper presents a simulation-based scan chain diagnosis algorithm for double faults in a scan chain. With an ordinary flush test pattern, only the last fault can be observed while the others are masked by the last fault. Considering the multiple faults, the forward fault and the rearward fault are decided by analyzing signatures of a faulty chain and good chains, separately. The results of analysis are upper bound (rearward fault) and lower bound (forward fault). If only one fault exists, there is only a candidate in the boundary. The proposed technique can be applied for both stuck-at and transition faults. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the diagnosis resolution is increased compared to the conventional method.",
author = "Hyeonchan Lim and Seokjun Jang and Sungho Kang",
year = "2019",
month = "2",
day = "22",
doi = "10.1109/ISOCC.2018.8649930",
language = "English",
series = "Proceedings - International SoC Design Conference 2018, ISOCC 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "265--266",
booktitle = "Proceedings - International SoC Design Conference 2018, ISOCC 2018",
address = "United States",

}

Lim, H, Jang, S & Kang, S 2019, A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. in Proceedings - International SoC Design Conference 2018, ISOCC 2018., 8649930, Proceedings - International SoC Design Conference 2018, ISOCC 2018, Institute of Electrical and Electronics Engineers Inc., pp. 265-266, 15th International SoC Design Conference, ISOCC 2018, Daegu, Korea, Republic of, 18/11/12. https://doi.org/10.1109/ISOCC.2018.8649930

A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. / Lim, Hyeonchan; Jang, Seokjun; Kang, Sungho.

Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., 2019. p. 265-266 8649930 (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain

AU - Lim, Hyeonchan

AU - Jang, Seokjun

AU - Kang, Sungho

PY - 2019/2/22

Y1 - 2019/2/22

N2 - This paper presents a simulation-based scan chain diagnosis algorithm for double faults in a scan chain. With an ordinary flush test pattern, only the last fault can be observed while the others are masked by the last fault. Considering the multiple faults, the forward fault and the rearward fault are decided by analyzing signatures of a faulty chain and good chains, separately. The results of analysis are upper bound (rearward fault) and lower bound (forward fault). If only one fault exists, there is only a candidate in the boundary. The proposed technique can be applied for both stuck-at and transition faults. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the diagnosis resolution is increased compared to the conventional method.

AB - This paper presents a simulation-based scan chain diagnosis algorithm for double faults in a scan chain. With an ordinary flush test pattern, only the last fault can be observed while the others are masked by the last fault. Considering the multiple faults, the forward fault and the rearward fault are decided by analyzing signatures of a faulty chain and good chains, separately. The results of analysis are upper bound (rearward fault) and lower bound (forward fault). If only one fault exists, there is only a candidate in the boundary. The proposed technique can be applied for both stuck-at and transition faults. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the diagnosis resolution is increased compared to the conventional method.

UR - http://www.scopus.com/inward/record.url?scp=85063221415&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85063221415&partnerID=8YFLogxK

U2 - 10.1109/ISOCC.2018.8649930

DO - 10.1109/ISOCC.2018.8649930

M3 - Conference contribution

AN - SCOPUS:85063221415

T3 - Proceedings - International SoC Design Conference 2018, ISOCC 2018

SP - 265

EP - 266

BT - Proceedings - International SoC Design Conference 2018, ISOCC 2018

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Lim H, Jang S, Kang S. A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. In Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc. 2019. p. 265-266. 8649930. (Proceedings - International SoC Design Conference 2018, ISOCC 2018). https://doi.org/10.1109/ISOCC.2018.8649930