A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain

Hyeonchan Lim; Seokjun Jang; Sungho Kang

doi:10.1109/ISOCC.2018.8649930

A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain

Hyeonchan Lim, Seokjun Jang, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents a simulation-based scan chain diagnosis algorithm for double faults in a scan chain. With an ordinary flush test pattern, only the last fault can be observed while the others are masked by the last fault. Considering the multiple faults, the forward fault and the rearward fault are decided by analyzing signatures of a faulty chain and good chains, separately. The results of analysis are upper bound (rearward fault) and lower bound (forward fault). If only one fault exists, there is only a candidate in the boundary. The proposed technique can be applied for both stuck-at and transition faults. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the diagnosis resolution is increased compared to the conventional method.

Original language	English
Title of host publication	Proceedings - International SoC Design Conference 2018, ISOCC 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	265-266
Number of pages	2
ISBN (Electronic)	9781538679609
DOIs	https://doi.org/10.1109/ISOCC.2018.8649930
Publication status	Published - 2019 Feb 22
Event	15th International SoC Design Conference, ISOCC 2018 - Daegu, Korea, Republic of Duration: 2018 Nov 12 → 2018 Nov 15

Publication series

Name	Proceedings - International SoC Design Conference 2018, ISOCC 2018

Conference

Conference	15th International SoC Design Conference, ISOCC 2018
Country/Territory	Korea, Republic of
City	Daegu
Period	18/11/12 → 18/11/15

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/ISOCC.2018.8649930

Cite this

Lim, H., Jang, S., & Kang, S. (2019). A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. In Proceedings - International SoC Design Conference 2018, ISOCC 2018 (pp. 265-266). [8649930] (Proceedings - International SoC Design Conference 2018, ISOCC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2018.8649930

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abstract = "This paper presents a simulation-based scan chain diagnosis algorithm for double faults in a scan chain. With an ordinary flush test pattern, only the last fault can be observed while the others are masked by the last fault. Considering the multiple faults, the forward fault and the rearward fault are decided by analyzing signatures of a faulty chain and good chains, separately. The results of analysis are upper bound (rearward fault) and lower bound (forward fault). If only one fault exists, there is only a candidate in the boundary. The proposed technique can be applied for both stuck-at and transition faults. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the diagnosis resolution is increased compared to the conventional method.",

author = "Hyeonchan Lim and Seokjun Jang and Sungho Kang",

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doi = "10.1109/ISOCC.2018.8649930",

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Lim, H, Jang, S & Kang, S 2019, A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. in Proceedings - International SoC Design Conference 2018, ISOCC 2018., 8649930, Proceedings - International SoC Design Conference 2018, ISOCC 2018, Institute of Electrical and Electronics Engineers Inc., pp. 265-266, 15th International SoC Design Conference, ISOCC 2018, Daegu, Korea, Republic of, 18/11/12. https://doi.org/10.1109/ISOCC.2018.8649930

A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. / Lim, Hyeonchan; Jang, Seokjun; Kang, Sungho.

Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., 2019. p. 265-266 8649930 (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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N2 - This paper presents a simulation-based scan chain diagnosis algorithm for double faults in a scan chain. With an ordinary flush test pattern, only the last fault can be observed while the others are masked by the last fault. Considering the multiple faults, the forward fault and the rearward fault are decided by analyzing signatures of a faulty chain and good chains, separately. The results of analysis are upper bound (rearward fault) and lower bound (forward fault). If only one fault exists, there is only a candidate in the boundary. The proposed technique can be applied for both stuck-at and transition faults. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the diagnosis resolution is increased compared to the conventional method.

AB - This paper presents a simulation-based scan chain diagnosis algorithm for double faults in a scan chain. With an ordinary flush test pattern, only the last fault can be observed while the others are masked by the last fault. Considering the multiple faults, the forward fault and the rearward fault are decided by analyzing signatures of a faulty chain and good chains, separately. The results of analysis are upper bound (rearward fault) and lower bound (forward fault). If only one fault exists, there is only a candidate in the boundary. The proposed technique can be applied for both stuck-at and transition faults. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the diagnosis resolution is increased compared to the conventional method.

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A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain

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