A study on the electrical properties of Al2O3/La 2O3/Al2O3 multi-stacked films using tunnel oxide annealed at various temperatures

Hyo June Kim, Seung Yong Cha, Doo Jin Choi

Research output: Contribution to journal › Article › peer-review

Abstract

The structural and electrical properties of Al2O 3/La2O3/Al2O3 (ALA) films using a tunnel oxide annealed at various temperatures were investigated. The program/erase properties of the ALA films using the tunnel oxide annealed at 600°C were superior to others. The program/erase voltage and time of the ALA films using the tunnel oxide annealed at 600°C were 11 V for 10 ms (program) and-11 V for 100 ms (erase), respectively, and the corresponding memory window was about 1.59 V. In the retention test, the Vth distributions of all films were not changed up to about 104 cycles. In this study, all data showed sufficient characteristics to be used in flash memory devices.

Original languageEnglish
Pages (from-to)436-440
Number of pages5
JournalJournal of the Korean Ceramic Society
Volume46
Issue number4
DOIs
Publication statusPublished - 2009 Jul

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites

Access to Document

Fingerprint Dive into the research topics of 'A study on the electrical properties of Al<sub>2</sub>O<sub>3</sub>/La <sub>2</sub>O<sub>3</sub>/Al<sub>2</sub>O<sub>3</sub> multi-stacked films using tunnel oxide annealed at various temperatures'. Together they form a unique fingerprint.

Cite this