A test methodology to screen scan-path failures

Junghwan Kim, Young Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

It is important to screen scan-path failures because scan-path failures affect product yield even though these are not related to the device functional operations. However, the additional efforts such as diagnosis are required to screen scanpath failures. In this paper, we propose a new test methodology to screen scan-path failures under the Automatic-Test-Pattern- Generation (ATPG) constraints and the multi-capture-clock condition without diagnosis. Experimental results show that the proposed methodology efficiently screens scan-path failures with high test coverage.

Original languageEnglish
Title of host publicationISOCC 2016 - International SoC Design Conference
Subtitle of host publicationSmart SoC for Intelligent Things
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages149-150
Number of pages2
ISBN (Electronic)9781467393089
DOIs
Publication statusPublished - 2016 Dec 27
Event13th International SoC Design Conference, ISOCC 2016 - Jeju, Korea, Republic of
Duration: 2016 Oct 232016 Oct 26

Publication series

NameISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things

Other

Other13th International SoC Design Conference, ISOCC 2016
CountryKorea, Republic of
CityJeju
Period16/10/2316/10/26

Fingerprint

Automatic test pattern generation
methodology
Clocks
clocks
products

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Instrumentation

Cite this

Kim, J., Lee, Y. W., Cheong, M., Seo, S., & Kang, S. (2016). A test methodology to screen scan-path failures. In ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things (pp. 149-150). [7799831] (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2016.7799831
Kim, Junghwan ; Lee, Young Woo ; Cheong, Minho ; Seo, Sungyoul ; Kang, Sungho. / A test methodology to screen scan-path failures. ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 149-150 (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).
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abstract = "It is important to screen scan-path failures because scan-path failures affect product yield even though these are not related to the device functional operations. However, the additional efforts such as diagnosis are required to screen scanpath failures. In this paper, we propose a new test methodology to screen scan-path failures under the Automatic-Test-Pattern- Generation (ATPG) constraints and the multi-capture-clock condition without diagnosis. Experimental results show that the proposed methodology efficiently screens scan-path failures with high test coverage.",
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Kim, J, Lee, YW, Cheong, M, Seo, S & Kang, S 2016, A test methodology to screen scan-path failures. in ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things., 7799831, ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things, Institute of Electrical and Electronics Engineers Inc., pp. 149-150, 13th International SoC Design Conference, ISOCC 2016, Jeju, Korea, Republic of, 16/10/23. https://doi.org/10.1109/ISOCC.2016.7799831

A test methodology to screen scan-path failures. / Kim, Junghwan; Lee, Young Woo; Cheong, Minho; Seo, Sungyoul; Kang, Sungho.

ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., 2016. p. 149-150 7799831 (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AB - It is important to screen scan-path failures because scan-path failures affect product yield even though these are not related to the device functional operations. However, the additional efforts such as diagnosis are required to screen scanpath failures. In this paper, we propose a new test methodology to screen scan-path failures under the Automatic-Test-Pattern- Generation (ATPG) constraints and the multi-capture-clock condition without diagnosis. Experimental results show that the proposed methodology efficiently screens scan-path failures with high test coverage.

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Kim J, Lee YW, Cheong M, Seo S, Kang S. A test methodology to screen scan-path failures. In ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc. 2016. p. 149-150. 7799831. (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things). https://doi.org/10.1109/ISOCC.2016.7799831