Abstract
It is important to screen scan-path failures because scan-path failures affect product yield even though these are not related to the device functional operations. However, the additional efforts such as diagnosis are required to screen scanpath failures. In this paper, we propose a new test methodology to screen scan-path failures under the Automatic-Test-Pattern- Generation (ATPG) constraints and the multi-capture-clock condition without diagnosis. Experimental results show that the proposed methodology efficiently screens scan-path failures with high test coverage.
| Original language | English |
|---|---|
| Title of host publication | ISOCC 2016 - International SoC Design Conference |
| Subtitle of host publication | Smart SoC for Intelligent Things |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 149-150 |
| Number of pages | 2 |
| ISBN (Electronic) | 9781467393089 |
| DOIs | |
| Publication status | Published - 2016 Dec 27 |
| Event | 13th International SoC Design Conference, ISOCC 2016 - Jeju, Korea, Republic of Duration: 2016 Oct 23 → 2016 Oct 26 |
Publication series
| Name | ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things |
|---|
Other
| Other | 13th International SoC Design Conference, ISOCC 2016 |
|---|---|
| Country | Korea, Republic of |
| City | Jeju |
| Period | 16/10/23 → 16/10/26 |
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All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering
- Instrumentation
Cite this
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A test methodology to screen scan-path failures. / Kim, Junghwan; Lee, Young Woo; Cheong, Minho; Seo, Sungyoul; Kang, Sungho.
ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., 2016. p. 149-150 7799831 (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - A test methodology to screen scan-path failures
AU - Kim, Junghwan
AU - Lee, Young Woo
AU - Cheong, Minho
AU - Seo, Sungyoul
AU - Kang, Sungho
PY - 2016/12/27
Y1 - 2016/12/27
N2 - It is important to screen scan-path failures because scan-path failures affect product yield even though these are not related to the device functional operations. However, the additional efforts such as diagnosis are required to screen scanpath failures. In this paper, we propose a new test methodology to screen scan-path failures under the Automatic-Test-Pattern- Generation (ATPG) constraints and the multi-capture-clock condition without diagnosis. Experimental results show that the proposed methodology efficiently screens scan-path failures with high test coverage.
AB - It is important to screen scan-path failures because scan-path failures affect product yield even though these are not related to the device functional operations. However, the additional efforts such as diagnosis are required to screen scanpath failures. In this paper, we propose a new test methodology to screen scan-path failures under the Automatic-Test-Pattern- Generation (ATPG) constraints and the multi-capture-clock condition without diagnosis. Experimental results show that the proposed methodology efficiently screens scan-path failures with high test coverage.
UR - http://www.scopus.com/inward/record.url?scp=85010332874&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85010332874&partnerID=8YFLogxK
U2 - 10.1109/ISOCC.2016.7799831
DO - 10.1109/ISOCC.2016.7799831
M3 - Conference contribution
AN - SCOPUS:85010332874
T3 - ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things
SP - 149
EP - 150
BT - ISOCC 2016 - International SoC Design Conference
PB - Institute of Electrical and Electronics Engineers Inc.
ER -