Abstract
It is important to screen scan-path failures because scan-path failures affect product yield even though these are not related to the device functional operations. However, the additional efforts such as diagnosis are required to screen scanpath failures. In this paper, we propose a new test methodology to screen scan-path failures under the Automatic-Test-Pattern- Generation (ATPG) constraints and the multi-capture-clock condition without diagnosis. Experimental results show that the proposed methodology efficiently screens scan-path failures with high test coverage.
Original language | English |
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Title of host publication | ISOCC 2016 - International SoC Design Conference |
Subtitle of host publication | Smart SoC for Intelligent Things |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 149-150 |
Number of pages | 2 |
ISBN (Electronic) | 9781467393089 |
DOIs | |
Publication status | Published - 2016 Dec 27 |
Event | 13th International SoC Design Conference, ISOCC 2016 - Jeju, Korea, Republic of Duration: 2016 Oct 23 → 2016 Oct 26 |
Publication series
Name | ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things |
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Other
Other | 13th International SoC Design Conference, ISOCC 2016 |
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Country/Territory | Korea, Republic of |
City | Jeju |
Period | 16/10/23 → 16/10/26 |
Bibliographical note
Publisher Copyright:© 2016 IEEE.
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering
- Instrumentation