A twin symbol encoding technique based on run-length for efficient test data compression

Jaeseok Park, Sungho Kang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Recent test data compression techniques raise concerns regarding power dissipation and compression efficiency. This letter proposes a new test data compression scheme, twin symbol encoding, that supports block division skills that can reduce hardware overhead. Our experimental results show that the proposed technique achieves both a high compression ratio and low-power dissipation. Therefore, the proposed scheme is an attractive solution for efficient test data compression.

Original languageEnglish
Pages (from-to)140-143
Number of pages4
JournalETRI Journal
Volume33
Issue number1
DOIs
Publication statusPublished - 2011 Feb 1

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Data compression
Energy dissipation
Hardware

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Computer Science(all)
  • Electronic, Optical and Magnetic Materials

Cite this

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abstract = "Recent test data compression techniques raise concerns regarding power dissipation and compression efficiency. This letter proposes a new test data compression scheme, twin symbol encoding, that supports block division skills that can reduce hardware overhead. Our experimental results show that the proposed technique achieves both a high compression ratio and low-power dissipation. Therefore, the proposed scheme is an attractive solution for efficient test data compression.",
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A twin symbol encoding technique based on run-length for efficient test data compression. / Park, Jaeseok; Kang, Sungho.

In: ETRI Journal, Vol. 33, No. 1, 01.02.2011, p. 140-143.

Research output: Contribution to journalArticle

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