A very efficient redundancy analysis method using fault grouping

Hyungjun Cho, Wooheon Kang, Sungho Kang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

To increase device memory yield, many manufacturers use incorporated redundancy to replace faulty cells. In this redundancy technology, the implementation of an effective redundancy analysis (RA) algorithm is essential. Various RA algorithms have been developed to repair faults in memory. However, nearly all of these RA algorithms have low analysis speeds. The more densely compacted the memory is, the more testing and repair time is needed. Even if the analysis speed is very high, the RA algorithm would be useless if it did not have a normalized repair rate of 100%. In addition, when the number of added spares is increased in the memory, then the memory space that must be searched with the RA algorithms can exceed the memory space within the automatic test equipment. A very efficient RA algorithm using simple calculations is proposed in this work so as to minimize both the repair time and memory consumption. In addition, the proposed algorithm generates an optimal solution using a tree-based algorithm in each fault group. Our experiment results show that the proposed RA algorithm is very efficient in terms of speed and repair.

Original languageEnglish
Pages (from-to)439-447
Number of pages9
JournalETRI Journal
Volume35
Issue number3
DOIs
Publication statusPublished - 2013 Jun 1

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Redundancy
Data storage equipment
Repair
Trees (mathematics)
Testing

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Electrical and Electronic Engineering

Cite this

Cho, Hyungjun ; Kang, Wooheon ; Kang, Sungho. / A very efficient redundancy analysis method using fault grouping. In: ETRI Journal. 2013 ; Vol. 35, No. 3. pp. 439-447.
@article{86a7cd8d6eb04ec2bbbda6148687f653,
title = "A very efficient redundancy analysis method using fault grouping",
abstract = "To increase device memory yield, many manufacturers use incorporated redundancy to replace faulty cells. In this redundancy technology, the implementation of an effective redundancy analysis (RA) algorithm is essential. Various RA algorithms have been developed to repair faults in memory. However, nearly all of these RA algorithms have low analysis speeds. The more densely compacted the memory is, the more testing and repair time is needed. Even if the analysis speed is very high, the RA algorithm would be useless if it did not have a normalized repair rate of 100{\%}. In addition, when the number of added spares is increased in the memory, then the memory space that must be searched with the RA algorithms can exceed the memory space within the automatic test equipment. A very efficient RA algorithm using simple calculations is proposed in this work so as to minimize both the repair time and memory consumption. In addition, the proposed algorithm generates an optimal solution using a tree-based algorithm in each fault group. Our experiment results show that the proposed RA algorithm is very efficient in terms of speed and repair.",
author = "Hyungjun Cho and Wooheon Kang and Sungho Kang",
year = "2013",
month = "6",
day = "1",
doi = "10.4218/etrij.13.0112.0467",
language = "English",
volume = "35",
pages = "439--447",
journal = "ETRI Journal",
issn = "1225-6463",
publisher = "ETRI",
number = "3",

}

A very efficient redundancy analysis method using fault grouping. / Cho, Hyungjun; Kang, Wooheon; Kang, Sungho.

In: ETRI Journal, Vol. 35, No. 3, 01.06.2013, p. 439-447.

Research output: Contribution to journalArticle

TY - JOUR

T1 - A very efficient redundancy analysis method using fault grouping

AU - Cho, Hyungjun

AU - Kang, Wooheon

AU - Kang, Sungho

PY - 2013/6/1

Y1 - 2013/6/1

N2 - To increase device memory yield, many manufacturers use incorporated redundancy to replace faulty cells. In this redundancy technology, the implementation of an effective redundancy analysis (RA) algorithm is essential. Various RA algorithms have been developed to repair faults in memory. However, nearly all of these RA algorithms have low analysis speeds. The more densely compacted the memory is, the more testing and repair time is needed. Even if the analysis speed is very high, the RA algorithm would be useless if it did not have a normalized repair rate of 100%. In addition, when the number of added spares is increased in the memory, then the memory space that must be searched with the RA algorithms can exceed the memory space within the automatic test equipment. A very efficient RA algorithm using simple calculations is proposed in this work so as to minimize both the repair time and memory consumption. In addition, the proposed algorithm generates an optimal solution using a tree-based algorithm in each fault group. Our experiment results show that the proposed RA algorithm is very efficient in terms of speed and repair.

AB - To increase device memory yield, many manufacturers use incorporated redundancy to replace faulty cells. In this redundancy technology, the implementation of an effective redundancy analysis (RA) algorithm is essential. Various RA algorithms have been developed to repair faults in memory. However, nearly all of these RA algorithms have low analysis speeds. The more densely compacted the memory is, the more testing and repair time is needed. Even if the analysis speed is very high, the RA algorithm would be useless if it did not have a normalized repair rate of 100%. In addition, when the number of added spares is increased in the memory, then the memory space that must be searched with the RA algorithms can exceed the memory space within the automatic test equipment. A very efficient RA algorithm using simple calculations is proposed in this work so as to minimize both the repair time and memory consumption. In addition, the proposed algorithm generates an optimal solution using a tree-based algorithm in each fault group. Our experiment results show that the proposed RA algorithm is very efficient in terms of speed and repair.

UR - http://www.scopus.com/inward/record.url?scp=84878573290&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84878573290&partnerID=8YFLogxK

U2 - 10.4218/etrij.13.0112.0467

DO - 10.4218/etrij.13.0112.0467

M3 - Article

VL - 35

SP - 439

EP - 447

JO - ETRI Journal

JF - ETRI Journal

SN - 1225-6463

IS - 3

ER -