Abnormal Output Characteristics of p-Type Low Temperature Polycrystalline Silicon Thin Film Transistor Fabricated on Polyimide Substrate

Seok Woo Lee, Chang Bum Park, Pyo Jin Jeon, Sung Wook Min, June Yeong Lim, Han Sol Lee, Jae Sung Yoo, Soon Sung Yoo, Seongil Im

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Abstract

We report on an abnormal output characteristics in p-type low temperature polycrystalline silicon thin-film transistors fabricated on polyimide (PI); negative differential conductance behavior is often observed in saturation region of drain current from large width devices. To understand such abnormal output characteristics, device dimension dependence was studied in a systematic way. As a result, we found that enhanced self-heating is mainly responsible originating from the poor thermal conductivity of PI substrate. A related degradation model is also proposed.

Original languageEnglish
Article number7302517
Pages (from-to)7-10
Number of pages4
JournalIEEE Journal of the Electron Devices Society
Volume4
Issue number1
DOIs
Publication statusPublished - 2016 Jan

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All Science Journal Classification (ASJC) codes

  • Biotechnology
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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