Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10-15

J. E. Stalnaker, S. A. Diddams, K. Kim, L. Hollberg, E. A. Donley, T. P. Heavner, S. R. Jefferts, F. Levi, T. E. Parker, J. C. Bergquist, W. M. Itano, M. J. Jensen, L. Lorini, W. H. Oskay, T. M. Fortier

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the technical details specific to our recent measurements of the optical frequency of the mercury single-ion frequency standard in terms of the SI second as realized by the NIST-F1 cesium fountain clock. In these measurements the total fractional uncertainty is ≈ 10-15, limited by the statistical measurement uncertainty. In this paper we will address the techniques employed for the optical-to-microwave comparison itself, which had an estimated fractional uncertainty of ∼ 3 × 10-16, limited by the stability of the electronics used for the comparison.

Original languageEnglish
Title of host publication2006 IEEE International Frequency Control Symposium and Exposition
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages462-469
Number of pages8
ISBN (Print)1424400740, 9781424400744
DOIs
Publication statusPublished - 2006 Jan 1
Event2006 IEEE International Frequency Control Symposium and Exposition - Miami, FL, United States
Duration: 2006 Jun 42006 Jun 7

Publication series

NameProceedings of the IEEE International Frequency Control Symposium and Exposition

Other

Other2006 IEEE International Frequency Control Symposium and Exposition
CountryUnited States
CityMiami, FL
Period06/6/406/6/7

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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    Stalnaker, J. E., Diddams, S. A., Kim, K., Hollberg, L., Donley, E. A., Heavner, T. P., Jefferts, S. R., Levi, F., Parker, T. E., Bergquist, J. C., Itano, W. M., Jensen, M. J., Lorini, L., Oskay, W. H., & Fortier, T. M. (2006). Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10-15. In 2006 IEEE International Frequency Control Symposium and Exposition (pp. 462-469). [4053808] (Proceedings of the IEEE International Frequency Control Symposium and Exposition). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/FREQ.2006.275430