Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10-15

J. E. Stalnaker; S. A. Diddams; K. Kim; L. Hollberg; E. A. Donley; T. P. Heavner; S. R. Jefferts; F. Levi; T. E. Parker; J. C. Bergquist; W. M. Itano; M. J. Jensen; L. Lorini; W. H. Oskay; T. M. Fortier

doi:10.1109/FREQ.2006.275430

Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10^-15

J. E. Stalnaker, S. A. Diddams, K. Kim, L. Hollberg, E. A. Donley, T. P. Heavner, S. R. Jefferts, F. Levi, T. E. Parker, J. C. Bergquist, W. M. Itano, M. J. Jensen, L. Lorini, W. H. Oskay, T. M. Fortier

Department of Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report the technical details specific to our recent measurements of the optical frequency of the mercury single-ion frequency standard in terms of the SI second as realized by the NIST-F1 cesium fountain clock. In these measurements the total fractional uncertainty is ≈ 10^-15, limited by the statistical measurement uncertainty. In this paper we will address the techniques employed for the optical-to-microwave comparison itself, which had an estimated fractional uncertainty of ∼ 3 × 10^-16, limited by the stability of the electronics used for the comparison.

Original language	English
Title of host publication	2006 IEEE International Frequency Control Symposium and Exposition
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	462-469
Number of pages	8
ISBN (Print)	1424400740, 9781424400744
DOIs	https://doi.org/10.1109/FREQ.2006.275430
Publication status	Published - 2006 Jan 1
Event	2006 IEEE International Frequency Control Symposium and Exposition - Miami, FL, United States Duration: 2006 Jun 4 → 2006 Jun 7

Publication series

Name	Proceedings of the IEEE International Frequency Control Symposium and Exposition

Other

Other	2006 IEEE International Frequency Control Symposium and Exposition
Country/Territory	United States
City	Miami, FL
Period	06/6/4 → 06/6/7

All Science Journal Classification (ASJC) codes

Engineering(all)

Access to Document

10.1109/FREQ.2006.275430

Cite this

Stalnaker, J. E., Diddams, S. A., Kim, K., Hollberg, L., Donley, E. A., Heavner, T. P., Jefferts, S. R., Levi, F., Parker, T. E., Bergquist, J. C., Itano, W. M., Jensen, M. J., Lorini, L., Oskay, W. H., & Fortier, T. M. (2006). Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10^-15. In 2006 IEEE International Frequency Control Symposium and Exposition (pp. 462-469). [4053808] (Proceedings of the IEEE International Frequency Control Symposium and Exposition). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/FREQ.2006.275430

Stalnaker, J. E. ; Diddams, S. A. ; Kim, K. et al. / Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10^-15. 2006 IEEE International Frequency Control Symposium and Exposition. Institute of Electrical and Electronics Engineers Inc., 2006. pp. 462-469 (Proceedings of the IEEE International Frequency Control Symposium and Exposition).

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title = "Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10-15",

abstract = "We report the technical details specific to our recent measurements of the optical frequency of the mercury single-ion frequency standard in terms of the SI second as realized by the NIST-F1 cesium fountain clock. In these measurements the total fractional uncertainty is ≈ 10-15, limited by the statistical measurement uncertainty. In this paper we will address the techniques employed for the optical-to-microwave comparison itself, which had an estimated fractional uncertainty of ∼ 3 × 10-16, limited by the stability of the electronics used for the comparison.",

author = "Stalnaker, {J. E.} and Diddams, {S. A.} and K. Kim and L. Hollberg and Donley, {E. A.} and Heavner, {T. P.} and Jefferts, {S. R.} and F. Levi and Parker, {T. E.} and Bergquist, {J. C.} and Itano, {W. M.} and Jensen, {M. J.} and L. Lorini and Oskay, {W. H.} and Fortier, {T. M.}",

year = "2006",

month = jan,

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doi = "10.1109/FREQ.2006.275430",

language = "English",

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series = "Proceedings of the IEEE International Frequency Control Symposium and Exposition",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "462--469",

booktitle = "2006 IEEE International Frequency Control Symposium and Exposition",

address = "United States",

note = "2006 IEEE International Frequency Control Symposium and Exposition ; Conference date: 04-06-2006 Through 07-06-2006",

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Stalnaker, JE, Diddams, SA, Kim, K, Hollberg, L, Donley, EA, Heavner, TP, Jefferts, SR, Levi, F, Parker, TE, Bergquist, JC, Itano, WM, Jensen, MJ, Lorini, L, Oskay, WH & Fortier, TM 2006, Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10^-15. in 2006 IEEE International Frequency Control Symposium and Exposition., 4053808, Proceedings of the IEEE International Frequency Control Symposium and Exposition, Institute of Electrical and Electronics Engineers Inc., pp. 462-469, 2006 IEEE International Frequency Control Symposium and Exposition, Miami, FL, United States, 06/6/4. https://doi.org/10.1109/FREQ.2006.275430

Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10^-15. / Stalnaker, J. E.; Diddams, S. A.; Kim, K. et al.

2006 IEEE International Frequency Control Symposium and Exposition. Institute of Electrical and Electronics Engineers Inc., 2006. p. 462-469 4053808 (Proceedings of the IEEE International Frequency Control Symposium and Exposition).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Parker, T. E.

AU - Bergquist, J. C.

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Stalnaker JE, Diddams SA, Kim K, Hollberg L, Donley EA, Heavner TP et al. Absolute optical frequency measurements with a fractional frequency uncertainty at 1 × 10^-15. In 2006 IEEE International Frequency Control Symposium and Exposition. Institute of Electrical and Electronics Engineers Inc. 2006. p. 462-469. 4053808. (Proceedings of the IEEE International Frequency Control Symposium and Exposition). https://doi.org/10.1109/FREQ.2006.275430