AC impedance characteristics of oxide film on zirconium

J. Y. Lim, B. C. Han, I. S. Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The electrochemical impedance spectroscopy was employed primarily to explore its potential as an in situ monitor of film thickness and microstructure during the oxide formation and growth on a pure zirconium in water. The oxide film growth was accelerated by anodization of zirconium metal in a buffered alkaline solution at room temperature. AC impedance was measured at corrosion potential at various cumulative anodic charges. The impedance data suggests that the oxide film can be modeled adequately by a parallel RC circuit with the concept of a constant phase element. The oxide thickness estimated from the AC impedance was observed to increase linearly with the cumulative anodic charge indicating that the current efficiency for oxide growth is only about 6 percent under the condition. The oxide thickness analyzed by Auger Electron Spectroscopy (AES) corresponded with that predicted from the anodic charge. Hence it is suggested that the AC impedance techniques can be used to monitor the inner imprevious layer of the Zr oxide.

Original languageEnglish
Title of host publicationProceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors -
EditorsS. Bruemmer, P. Ford, G. Was, S. Breummer, P. Ford, G. Was
Pages1145-1151
Number of pages7
Publication statusPublished - 1999 Dec 1
EventProceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors - - New Portbeach, CA, United States
Duration: 1999 Aug 11999 Aug 5

Other

OtherProceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors -
CountryUnited States
CityNew Portbeach, CA
Period99/8/199/8/5

Fingerprint

Zirconium
Oxide films
Oxides
Film growth
Auger electron spectroscopy
Electrochemical impedance spectroscopy
Film thickness
Corrosion
Microstructure
Networks (circuits)
Metals
Water
Temperature

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Lim, J. Y., Han, B. C., & Hwang, I. S. (1999). AC impedance characteristics of oxide film on zirconium. In S. Bruemmer, P. Ford, G. Was, S. Breummer, P. Ford, & G. Was (Eds.), Proceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors - (pp. 1145-1151)
Lim, J. Y. ; Han, B. C. ; Hwang, I. S. / AC impedance characteristics of oxide film on zirconium. Proceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors -. editor / S. Bruemmer ; P. Ford ; G. Was ; S. Breummer ; P. Ford ; G. Was. 1999. pp. 1145-1151
@inproceedings{cab9df59c9fe456fa8adb0dab1de684b,
title = "AC impedance characteristics of oxide film on zirconium",
abstract = "The electrochemical impedance spectroscopy was employed primarily to explore its potential as an in situ monitor of film thickness and microstructure during the oxide formation and growth on a pure zirconium in water. The oxide film growth was accelerated by anodization of zirconium metal in a buffered alkaline solution at room temperature. AC impedance was measured at corrosion potential at various cumulative anodic charges. The impedance data suggests that the oxide film can be modeled adequately by a parallel RC circuit with the concept of a constant phase element. The oxide thickness estimated from the AC impedance was observed to increase linearly with the cumulative anodic charge indicating that the current efficiency for oxide growth is only about 6 percent under the condition. The oxide thickness analyzed by Auger Electron Spectroscopy (AES) corresponded with that predicted from the anodic charge. Hence it is suggested that the AC impedance techniques can be used to monitor the inner imprevious layer of the Zr oxide.",
author = "Lim, {J. Y.} and Han, {B. C.} and Hwang, {I. S.}",
year = "1999",
month = "12",
day = "1",
language = "English",
isbn = "0873394755",
pages = "1145--1151",
editor = "S. Bruemmer and P. Ford and G. Was and S. Breummer and P. Ford and G. Was",
booktitle = "Proceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors -",

}

Lim, JY, Han, BC & Hwang, IS 1999, AC impedance characteristics of oxide film on zirconium. in S Bruemmer, P Ford, G Was, S Breummer, P Ford & G Was (eds), Proceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors -. pp. 1145-1151, Proceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors -, New Portbeach, CA, United States, 99/8/1.

AC impedance characteristics of oxide film on zirconium. / Lim, J. Y.; Han, B. C.; Hwang, I. S.

Proceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors -. ed. / S. Bruemmer; P. Ford; G. Was; S. Breummer; P. Ford; G. Was. 1999. p. 1145-1151.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - AC impedance characteristics of oxide film on zirconium

AU - Lim, J. Y.

AU - Han, B. C.

AU - Hwang, I. S.

PY - 1999/12/1

Y1 - 1999/12/1

N2 - The electrochemical impedance spectroscopy was employed primarily to explore its potential as an in situ monitor of film thickness and microstructure during the oxide formation and growth on a pure zirconium in water. The oxide film growth was accelerated by anodization of zirconium metal in a buffered alkaline solution at room temperature. AC impedance was measured at corrosion potential at various cumulative anodic charges. The impedance data suggests that the oxide film can be modeled adequately by a parallel RC circuit with the concept of a constant phase element. The oxide thickness estimated from the AC impedance was observed to increase linearly with the cumulative anodic charge indicating that the current efficiency for oxide growth is only about 6 percent under the condition. The oxide thickness analyzed by Auger Electron Spectroscopy (AES) corresponded with that predicted from the anodic charge. Hence it is suggested that the AC impedance techniques can be used to monitor the inner imprevious layer of the Zr oxide.

AB - The electrochemical impedance spectroscopy was employed primarily to explore its potential as an in situ monitor of film thickness and microstructure during the oxide formation and growth on a pure zirconium in water. The oxide film growth was accelerated by anodization of zirconium metal in a buffered alkaline solution at room temperature. AC impedance was measured at corrosion potential at various cumulative anodic charges. The impedance data suggests that the oxide film can be modeled adequately by a parallel RC circuit with the concept of a constant phase element. The oxide thickness estimated from the AC impedance was observed to increase linearly with the cumulative anodic charge indicating that the current efficiency for oxide growth is only about 6 percent under the condition. The oxide thickness analyzed by Auger Electron Spectroscopy (AES) corresponded with that predicted from the anodic charge. Hence it is suggested that the AC impedance techniques can be used to monitor the inner imprevious layer of the Zr oxide.

UR - http://www.scopus.com/inward/record.url?scp=0033489222&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033489222&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0033489222

SN - 0873394755

SP - 1145

EP - 1151

BT - Proceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors -

A2 - Bruemmer, S.

A2 - Ford, P.

A2 - Was, G.

A2 - Breummer, S.

A2 - Ford, P.

A2 - Was, G.

ER -

Lim JY, Han BC, Hwang IS. AC impedance characteristics of oxide film on zirconium. In Bruemmer S, Ford P, Was G, Breummer S, Ford P, Was G, editors, Proceedings of the Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors -. 1999. p. 1145-1151