Aging effect of SiO2 xerogel film on its microstructure and dielectric properties

Jung Ho Kim, Hong Ryul Kim, Hyung-Ho Park, Sang Hoon Hyun

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The properties of porous SiO2 xerogel film strongly depend on the aging process. The morphology of the surface modified SiO2 xerogel film pre-aged for 1 hr at 70 °C showed a two-dimensional structure. Aging for 12 h at 70 °C and successive modification of the film induced some particle growth and a three-dimensional network structure. The microstructure of the modified SiO2 xerogel films reflects the preformed structure during aging. The surface modification induced the changes of surface coverage from -OC2H5 and -OH bonds to -CH3. However the content of surface chemical species was almost same regardless of aging time. The porosity of the modified sample pre-aged for 12 h at 70 °C was 89%. The calculated/measured dielectric constants were 1.31/1.42, respectively.

Original languageEnglish
Pages (from-to)452-456
Number of pages5
JournalApplied Surface Science
Volume169-170
DOIs
Publication statusPublished - 2001 Jan 15

Fingerprint

Xerogels
Dielectric properties
Aging of materials
Microstructure
Surface treatment
Permittivity
Porosity

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

Kim, Jung Ho ; Kim, Hong Ryul ; Park, Hyung-Ho ; Hyun, Sang Hoon. / Aging effect of SiO2 xerogel film on its microstructure and dielectric properties. In: Applied Surface Science. 2001 ; Vol. 169-170. pp. 452-456.
@article{ef27ab744f6f4a9e9bea4ac31336e154,
title = "Aging effect of SiO2 xerogel film on its microstructure and dielectric properties",
abstract = "The properties of porous SiO2 xerogel film strongly depend on the aging process. The morphology of the surface modified SiO2 xerogel film pre-aged for 1 hr at 70 °C showed a two-dimensional structure. Aging for 12 h at 70 °C and successive modification of the film induced some particle growth and a three-dimensional network structure. The microstructure of the modified SiO2 xerogel films reflects the preformed structure during aging. The surface modification induced the changes of surface coverage from -OC2H5 and -OH bonds to -CH3. However the content of surface chemical species was almost same regardless of aging time. The porosity of the modified sample pre-aged for 12 h at 70 °C was 89{\%}. The calculated/measured dielectric constants were 1.31/1.42, respectively.",
author = "Kim, {Jung Ho} and Kim, {Hong Ryul} and Hyung-Ho Park and Hyun, {Sang Hoon}",
year = "2001",
month = "1",
day = "15",
doi = "10.1016/S0169-4332(00)00702-9",
language = "English",
volume = "169-170",
pages = "452--456",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",

}

Aging effect of SiO2 xerogel film on its microstructure and dielectric properties. / Kim, Jung Ho; Kim, Hong Ryul; Park, Hyung-Ho; Hyun, Sang Hoon.

In: Applied Surface Science, Vol. 169-170, 15.01.2001, p. 452-456.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Aging effect of SiO2 xerogel film on its microstructure and dielectric properties

AU - Kim, Jung Ho

AU - Kim, Hong Ryul

AU - Park, Hyung-Ho

AU - Hyun, Sang Hoon

PY - 2001/1/15

Y1 - 2001/1/15

N2 - The properties of porous SiO2 xerogel film strongly depend on the aging process. The morphology of the surface modified SiO2 xerogel film pre-aged for 1 hr at 70 °C showed a two-dimensional structure. Aging for 12 h at 70 °C and successive modification of the film induced some particle growth and a three-dimensional network structure. The microstructure of the modified SiO2 xerogel films reflects the preformed structure during aging. The surface modification induced the changes of surface coverage from -OC2H5 and -OH bonds to -CH3. However the content of surface chemical species was almost same regardless of aging time. The porosity of the modified sample pre-aged for 12 h at 70 °C was 89%. The calculated/measured dielectric constants were 1.31/1.42, respectively.

AB - The properties of porous SiO2 xerogel film strongly depend on the aging process. The morphology of the surface modified SiO2 xerogel film pre-aged for 1 hr at 70 °C showed a two-dimensional structure. Aging for 12 h at 70 °C and successive modification of the film induced some particle growth and a three-dimensional network structure. The microstructure of the modified SiO2 xerogel films reflects the preformed structure during aging. The surface modification induced the changes of surface coverage from -OC2H5 and -OH bonds to -CH3. However the content of surface chemical species was almost same regardless of aging time. The porosity of the modified sample pre-aged for 12 h at 70 °C was 89%. The calculated/measured dielectric constants were 1.31/1.42, respectively.

UR - http://www.scopus.com/inward/record.url?scp=0035127134&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035127134&partnerID=8YFLogxK

U2 - 10.1016/S0169-4332(00)00702-9

DO - 10.1016/S0169-4332(00)00702-9

M3 - Article

VL - 169-170

SP - 452

EP - 456

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -