Alignment of the wedge scanner prism utilizing second order split reflection

Jinsuk Hong, Jung Hwan Shin, Hae Seog Koh, Sug Whan Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The designed wedge scanner has conventional raster scan pattern canceling the movement along one axis by rotating opposite direction, in which case the alignment of these two wedge scanners affects the imaging performance of the system. To align the wedge scanners more efficiently and effectively, 2nd split rays are used. The ray tracing was performed to predict the precision achievable. The sensitivity according to the movement of the scanner is dependent on the refractive index and slant angle of the wedge and was about 350 times more sensitive when the angle between two vertexes of wedge scanners reaches 1°. The goal was successfully achieved below 0.6 mm in the screen 5 m away, which is 1/4 of the alignment goal.

Original languageEnglish
Title of host publicationOptical Design and Testing IX
EditorsYongtian Wang, Pablo Benitez, Osamu Matoba
ISBN (Electronic)9781510630871
Publication statusPublished - 2019
EventOptical Design and Testing IX 2019 - Hangzhou, China
Duration: 2019 Oct 212019 Oct 22

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceOptical Design and Testing IX 2019

Bibliographical note

Funding Information:
We acknowledge the support of the National Research Foundation of Korea to the Center for Galaxy Evolution Research (No. 2017R1A5A1070354) and Breault Research Organization through the user licenses for Advanced System Analysis Program (ASAP ® ) for ray tracing computation.

Publisher Copyright:
© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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