Alignment properties of liquid crystal molecules with negative dielectric anisotropy on hydrogenated silicon carbide films

Won Hoe Koo; Jong Bok Kim; Byoung Har Hwang; Jong Tae Kim; Sung Jin Jo; Chang Su Kim; Se Jong Lee; Hong Koo Baik

doi:10.1143/JJAP.47.4617

Alignment properties of liquid crystal molecules with negative dielectric anisotropy on hydrogenated silicon carbide films

Won Hoe Koo, Jong Bok Kim, Byoung Har Hwang, Jong Tae Kim, Sung Jin Jo, Chang Su Kim, Se Jong Lee, Hong Koo Baik

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We study the alignment properties of liquid crystals (LCs) with a negative dielectric anisotropy on a hydrogenated silicon carbide (SiC:H) film, which is an alternative alignment material. SiC:H layers align LC molecules with a negative dielectric anisotropy via ion beam (IB) irradiation and control the pretilt angle in a range from 90 to 75° depending on the change of IB irradiation angle. Also, when they are exposed to high temperatures for a long time, they show robust properties without degradation. We conclude that although the SiC:H alignment layers are not sensitive to IB irradiation compared with the SiC layers, they show a potential as alternative LC alignment layers for IB irradiation method.

Original language	English
Pages (from-to)	4617-4619
Number of pages	3
Journal	Japanese journal of applied physics
Volume	47
Issue number	6 PART 1
DOIs	https://doi.org/10.1143/JJAP.47.4617
Publication status	Published - 2008 Jun 13

All Science Journal Classification (ASJC) codes

Engineering(all)
Physics and Astronomy(all)

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title = "Alignment properties of liquid crystal molecules with negative dielectric anisotropy on hydrogenated silicon carbide films",

abstract = "We study the alignment properties of liquid crystals (LCs) with a negative dielectric anisotropy on a hydrogenated silicon carbide (SiC:H) film, which is an alternative alignment material. SiC:H layers align LC molecules with a negative dielectric anisotropy via ion beam (IB) irradiation and control the pretilt angle in a range from 90 to 75° depending on the change of IB irradiation angle. Also, when they are exposed to high temperatures for a long time, they show robust properties without degradation. We conclude that although the SiC:H alignment layers are not sensitive to IB irradiation compared with the SiC layers, they show a potential as alternative LC alignment layers for IB irradiation method.",

author = "Koo, {Won Hoe} and Kim, {Jong Bok} and Hwang, {Byoung Har} and Kim, {Jong Tae} and Jo, {Sung Jin} and Kim, {Chang Su} and Lee, {Se Jong} and Baik, {Hong Koo}",

year = "2008",

month = jun,

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doi = "10.1143/JJAP.47.4617",

language = "English",

volume = "47",

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journal = "Japanese Journal of Applied Physics",

issn = "0021-4922",

number = "6 PART 1",

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Alignment properties of liquid crystal molecules with negative dielectric anisotropy on hydrogenated silicon carbide films. / Koo, Won Hoe; Kim, Jong Bok; Hwang, Byoung Har; Kim, Jong Tae; Jo, Sung Jin; Kim, Chang Su; Lee, Se Jong; Baik, Hong Koo.

In: Japanese journal of applied physics, Vol. 47, No. 6 PART 1, 13.06.2008, p. 4617-4619.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Alignment properties of liquid crystal molecules with negative dielectric anisotropy on hydrogenated silicon carbide films

AU - Koo, Won Hoe

AU - Kim, Jong Bok

AU - Hwang, Byoung Har

AU - Kim, Jong Tae

AU - Jo, Sung Jin

AU - Kim, Chang Su

AU - Lee, Se Jong

AU - Baik, Hong Koo

PY - 2008/6/13

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N2 - We study the alignment properties of liquid crystals (LCs) with a negative dielectric anisotropy on a hydrogenated silicon carbide (SiC:H) film, which is an alternative alignment material. SiC:H layers align LC molecules with a negative dielectric anisotropy via ion beam (IB) irradiation and control the pretilt angle in a range from 90 to 75° depending on the change of IB irradiation angle. Also, when they are exposed to high temperatures for a long time, they show robust properties without degradation. We conclude that although the SiC:H alignment layers are not sensitive to IB irradiation compared with the SiC layers, they show a potential as alternative LC alignment layers for IB irradiation method.

AB - We study the alignment properties of liquid crystals (LCs) with a negative dielectric anisotropy on a hydrogenated silicon carbide (SiC:H) film, which is an alternative alignment material. SiC:H layers align LC molecules with a negative dielectric anisotropy via ion beam (IB) irradiation and control the pretilt angle in a range from 90 to 75° depending on the change of IB irradiation angle. Also, when they are exposed to high temperatures for a long time, they show robust properties without degradation. We conclude that although the SiC:H alignment layers are not sensitive to IB irradiation compared with the SiC layers, they show a potential as alternative LC alignment layers for IB irradiation method.

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Alignment properties of liquid crystal molecules with negative dielectric anisotropy on hydrogenated silicon carbide films

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