All-digital 90°phase-shift DLL with a dithering jitter suppression scheme

Dong Hoon Jung, Kyungho Ryu, Jung Hyun Park, Won Lee, Seong Ook Jung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

We propose a 90°phase-shift digital delay-locked loop (DLL) with a new dithering jitter suppression scheme. Delay-line control code dithering is effectively suppressed by comparing the distribution of the input and the output clock jitter. The proposed scheme is analyzed through a stochastic calculation. A test chip is fabricated using a 45-nm CMOS technology, and a 1.95-ps rms and 12.89-ps peak-to-peak jitter are achieved at 800-MHz operating frequency with a 1.1-V supply voltage. The measured power consumption is 1.32 mW at 800 MHz, and the active chip area is 69.9 /am χ 49.3 /am.

Original languageEnglish
Title of host publicationProceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781467361460
DOIs
Publication statusPublished - 2013 Nov 7
Event35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013 - San Jose, CA, United States
Duration: 2013 Sep 222013 Sep 25

Publication series

NameProceedings of the Custom Integrated Circuits Conference
ISSN (Print)0886-5930

Other

Other35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013
CountryUnited States
CitySan Jose, CA
Period13/9/2213/9/25

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Jung, D. H., Ryu, K., Park, J. H., Lee, W., & Jung, S. O. (2013). All-digital 90°phase-shift DLL with a dithering jitter suppression scheme. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013 [6658534] (Proceedings of the Custom Integrated Circuits Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2013.6658534