Alleviation of recoverable residual image phenomenon of flexible organic light-emitting diode display

Seonghwan Hongt; Han Wook Hwang; Sang Soo Hwang; Ki Woo Kim; Yong Min Ha; Hyun Jae Kim

doi:10.1002/sdtp.12866

Alleviation of recoverable residual image phenomenon of flexible organic light-emitting diode display

Seonghwan Hongt, Han Wook Hwang, Sang Soo Hwang, Ki Woo Kim, Yong Min Ha, Hyun Jae Kim

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

Electric field shielding (EFS) layer inserted low-temperature polycrystalllne silicon thin-film transistor was suggested to alleviate recoverable residual Image phenomenon in organic light-emitting diode display using polylmlde substrate. It was found that the recoverable residual Image was strongly attributed to charge distribution inside polylmlde, and It can be Inhibited by EFS.

Original language	English
Pages (from-to)	105-108
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	50
Issue number	Book 1
DOIs	https://doi.org/10.1002/sdtp.12866
Publication status	Published - 2019
Event	SID Symposium, Seminar, and Exhibition 2019, Display Week 2019 - San Jose, United States Duration: 2019 May 12 → 2019 May 17

Bibliographical note

Funding Information:
This work was supported by the LG Display Co., Ltd. and the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2018M3A7B4071517).

Publisher Copyright:
© 2019 SID.

All Science Journal Classification (ASJC) codes

Engineering(all)

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10.1002/sdtp.12866

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@article{5c6082456c8545ce9f8ac319aab2a850,

title = "Alleviation of recoverable residual image phenomenon of flexible organic light-emitting diode display",

abstract = "Electric field shielding (EFS) layer inserted low-temperature polycrystalllne silicon thin-film transistor was suggested to alleviate recoverable residual Image phenomenon in organic light-emitting diode display using polylmlde substrate. It was found that the recoverable residual Image was strongly attributed to charge distribution inside polylmlde, and It can be Inhibited by EFS.",

author = "Seonghwan Hongt and Hwang, {Han Wook} and Hwang, {Sang Soo} and Kim, {Ki Woo} and Ha, {Yong Min} and Kim, {Hyun Jae}",

note = "Funding Information: This work was supported by the LG Display Co., Ltd. and the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2018M3A7B4071517). Publisher Copyright: {\textcopyright} 2019 SID.; SID Symposium, Seminar, and Exhibition 2019, Display Week 2019 ; Conference date: 12-05-2019 Through 17-05-2019",

year = "2019",

doi = "10.1002/sdtp.12866",

language = "English",

volume = "50",

pages = "105--108",

journal = "Digest of Technical Papers - SID International Symposium",

issn = "0097-966X",

number = "Book 1",

}

TY - JOUR

T1 - Alleviation of recoverable residual image phenomenon of flexible organic light-emitting diode display

AU - Hongt, Seonghwan

AU - Hwang, Han Wook

AU - Hwang, Sang Soo

AU - Kim, Ki Woo

AU - Ha, Yong Min

AU - Kim, Hyun Jae

N1 - Funding Information: This work was supported by the LG Display Co., Ltd. and the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2018M3A7B4071517). Publisher Copyright: © 2019 SID.

PY - 2019

Y1 - 2019

N2 - Electric field shielding (EFS) layer inserted low-temperature polycrystalllne silicon thin-film transistor was suggested to alleviate recoverable residual Image phenomenon in organic light-emitting diode display using polylmlde substrate. It was found that the recoverable residual Image was strongly attributed to charge distribution inside polylmlde, and It can be Inhibited by EFS.

AB - Electric field shielding (EFS) layer inserted low-temperature polycrystalllne silicon thin-film transistor was suggested to alleviate recoverable residual Image phenomenon in organic light-emitting diode display using polylmlde substrate. It was found that the recoverable residual Image was strongly attributed to charge distribution inside polylmlde, and It can be Inhibited by EFS.

UR - http://www.scopus.com/inward/record.url?scp=85081154482&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85081154482&partnerID=8YFLogxK

U2 - 10.1002/sdtp.12866

DO - 10.1002/sdtp.12866

M3 - Conference article

AN - SCOPUS:85081154482

SN - 0097-966X

VL - 50

SP - 105

EP - 108

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - Book 1

T2 - SID Symposium, Seminar, and Exhibition 2019, Display Week 2019

Y2 - 12 May 2019 through 17 May 2019

ER -

Alleviation of recoverable residual image phenomenon of flexible organic light-emitting diode display

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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