Alphabet-Dependent Bounds for Locally Repairable Codes with Joint Information Availability

Jung Hyun Kim, Hong Yeop Song

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

In this letter, we investigate a class of codes with the following property: any decodable set of erased symbols can be repaired from any single set of several disjoint symbol sets with small cardinality. We refer such codes to locally repairable codes (LRCs) with joint availability. In particular, if information symbols of a code have this property, then we refer the code to an LRC with joint information availability. We propose two alphabet-dependent bounds for LRCs with joint information availability. From the bounds, we rederive some well-known bounds for LRCs. Based on the relation between LRCs and batch codes, we also present an alternative proof of an existing bound for batch codes. Finally, we show the achievability and tightness of the proposed bounds using graph-based codes.

Original languageEnglish
Article number7915672
Pages (from-to)1687-1690
Number of pages4
JournalIEEE Communications Letters
Volume21
Issue number8
DOIs
Publication statusPublished - 2017 Aug

Bibliographical note

Funding Information:
Manuscript received March 8, 2017; revised April 10, 2017; accepted April 25, 2017. Date of publication April 27, 2017; date of current version August 10, 2017. This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (No. 2013R1A1A2062061). The associate editor coordinating the review of this letter and approving it for publication was J. Li. (Corresponding author: Hong-Yeop Song.) The authors are with the Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, South Korea (e-mail: hysong@yonsei.ac.kr). Digital Object Identifier 10.1109/LCOMM.2017.2699968

Publisher Copyright:
© 2017 IEEE.

All Science Journal Classification (ASJC) codes

  • Modelling and Simulation
  • Computer Science Applications
  • Electrical and Electronic Engineering

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