Amplifier for scanning tunneling microscopy at MHz frequencies

K. M. Bastiaans, T. Benschop, D. Chatzopoulos, D. Cho, Q. Dong, Y. Jin, M. P. Allan

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Conventional scanning tunneling microscopy (STM) is limited to a bandwidth of a few kHz around DC. Here, we develop, build, and test a novel amplifier circuit capable of measuring the tunneling current in the MHz regime while simultaneously performing conventional STM measurements. This is achieved with an amplifier circuit including a LC tank with a quality factor exceeding 600 and a home-built, low-noise high electron mobility transistor. The amplifier circuit functions while simultaneously scanning with atomic resolution in the tunneling regime, i.e., at junction resistances in the range of giga-ohms, and down towards point contact spectroscopy. To enable high signal-to-noise ratios and meet all technical requirements for the inclusion in a commercial low temperature, ultra-high vacuum STM, we use superconducting cross-wound inductors and choose materials and circuit elements with low heat load. We demonstrate the high performance of the amplifier by spatially mapping the Poissonian noise of tunneling electrons on an atomically clean Au(111) surface. We also show differential conductance spectroscopy measurements at 3 MHz, demonstrating superior performance over conventional spectroscopy techniques. Further, our technology could be used to perform impedance matched spin resonance and distinguish Majorana modes from more conventional edge states.

Original languageEnglish
Article number093709
JournalReview of Scientific Instruments
Volume89
Issue number9
DOIs
Publication statusPublished - 2018 Sep 1

Fingerprint

Scanning tunneling microscopy
scanning tunneling microscopy
amplifiers
Networks (circuits)
Spectroscopy
spectroscopy
spin resonance
Electron tunneling
Point contacts
Ultrahigh vacuum
High electron mobility transistors
inductors
Thermal load
electron tunneling
high electron mobility transistors
low noise
ultrahigh vacuum
Q factors
Signal to noise ratio
signal to noise ratios

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Bastiaans, K. M., Benschop, T., Chatzopoulos, D., Cho, D., Dong, Q., Jin, Y., & Allan, M. P. (2018). Amplifier for scanning tunneling microscopy at MHz frequencies. Review of Scientific Instruments, 89(9), [093709]. https://doi.org/10.1063/1.5043267
Bastiaans, K. M. ; Benschop, T. ; Chatzopoulos, D. ; Cho, D. ; Dong, Q. ; Jin, Y. ; Allan, M. P. / Amplifier for scanning tunneling microscopy at MHz frequencies. In: Review of Scientific Instruments. 2018 ; Vol. 89, No. 9.
@article{de55d32ae30f42f29e512f008f778558,
title = "Amplifier for scanning tunneling microscopy at MHz frequencies",
abstract = "Conventional scanning tunneling microscopy (STM) is limited to a bandwidth of a few kHz around DC. Here, we develop, build, and test a novel amplifier circuit capable of measuring the tunneling current in the MHz regime while simultaneously performing conventional STM measurements. This is achieved with an amplifier circuit including a LC tank with a quality factor exceeding 600 and a home-built, low-noise high electron mobility transistor. The amplifier circuit functions while simultaneously scanning with atomic resolution in the tunneling regime, i.e., at junction resistances in the range of giga-ohms, and down towards point contact spectroscopy. To enable high signal-to-noise ratios and meet all technical requirements for the inclusion in a commercial low temperature, ultra-high vacuum STM, we use superconducting cross-wound inductors and choose materials and circuit elements with low heat load. We demonstrate the high performance of the amplifier by spatially mapping the Poissonian noise of tunneling electrons on an atomically clean Au(111) surface. We also show differential conductance spectroscopy measurements at 3 MHz, demonstrating superior performance over conventional spectroscopy techniques. Further, our technology could be used to perform impedance matched spin resonance and distinguish Majorana modes from more conventional edge states.",
author = "Bastiaans, {K. M.} and T. Benschop and D. Chatzopoulos and D. Cho and Q. Dong and Y. Jin and Allan, {M. P.}",
year = "2018",
month = "9",
day = "1",
doi = "10.1063/1.5043267",
language = "English",
volume = "89",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "9",

}

Bastiaans, KM, Benschop, T, Chatzopoulos, D, Cho, D, Dong, Q, Jin, Y & Allan, MP 2018, 'Amplifier for scanning tunneling microscopy at MHz frequencies', Review of Scientific Instruments, vol. 89, no. 9, 093709. https://doi.org/10.1063/1.5043267

Amplifier for scanning tunneling microscopy at MHz frequencies. / Bastiaans, K. M.; Benschop, T.; Chatzopoulos, D.; Cho, D.; Dong, Q.; Jin, Y.; Allan, M. P.

In: Review of Scientific Instruments, Vol. 89, No. 9, 093709, 01.09.2018.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Amplifier for scanning tunneling microscopy at MHz frequencies

AU - Bastiaans, K. M.

AU - Benschop, T.

AU - Chatzopoulos, D.

AU - Cho, D.

AU - Dong, Q.

AU - Jin, Y.

AU - Allan, M. P.

PY - 2018/9/1

Y1 - 2018/9/1

N2 - Conventional scanning tunneling microscopy (STM) is limited to a bandwidth of a few kHz around DC. Here, we develop, build, and test a novel amplifier circuit capable of measuring the tunneling current in the MHz regime while simultaneously performing conventional STM measurements. This is achieved with an amplifier circuit including a LC tank with a quality factor exceeding 600 and a home-built, low-noise high electron mobility transistor. The amplifier circuit functions while simultaneously scanning with atomic resolution in the tunneling regime, i.e., at junction resistances in the range of giga-ohms, and down towards point contact spectroscopy. To enable high signal-to-noise ratios and meet all technical requirements for the inclusion in a commercial low temperature, ultra-high vacuum STM, we use superconducting cross-wound inductors and choose materials and circuit elements with low heat load. We demonstrate the high performance of the amplifier by spatially mapping the Poissonian noise of tunneling electrons on an atomically clean Au(111) surface. We also show differential conductance spectroscopy measurements at 3 MHz, demonstrating superior performance over conventional spectroscopy techniques. Further, our technology could be used to perform impedance matched spin resonance and distinguish Majorana modes from more conventional edge states.

AB - Conventional scanning tunneling microscopy (STM) is limited to a bandwidth of a few kHz around DC. Here, we develop, build, and test a novel amplifier circuit capable of measuring the tunneling current in the MHz regime while simultaneously performing conventional STM measurements. This is achieved with an amplifier circuit including a LC tank with a quality factor exceeding 600 and a home-built, low-noise high electron mobility transistor. The amplifier circuit functions while simultaneously scanning with atomic resolution in the tunneling regime, i.e., at junction resistances in the range of giga-ohms, and down towards point contact spectroscopy. To enable high signal-to-noise ratios and meet all technical requirements for the inclusion in a commercial low temperature, ultra-high vacuum STM, we use superconducting cross-wound inductors and choose materials and circuit elements with low heat load. We demonstrate the high performance of the amplifier by spatially mapping the Poissonian noise of tunneling electrons on an atomically clean Au(111) surface. We also show differential conductance spectroscopy measurements at 3 MHz, demonstrating superior performance over conventional spectroscopy techniques. Further, our technology could be used to perform impedance matched spin resonance and distinguish Majorana modes from more conventional edge states.

UR - http://www.scopus.com/inward/record.url?scp=85054160114&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85054160114&partnerID=8YFLogxK

U2 - 10.1063/1.5043267

DO - 10.1063/1.5043267

M3 - Article

C2 - 30278769

AN - SCOPUS:85054160114

VL - 89

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 9

M1 - 093709

ER -

Bastiaans KM, Benschop T, Chatzopoulos D, Cho D, Dong Q, Jin Y et al. Amplifier for scanning tunneling microscopy at MHz frequencies. Review of Scientific Instruments. 2018 Sep 1;89(9). 093709. https://doi.org/10.1063/1.5043267