An accurate diagnosis of transition fault clusters based on single fault simulation

Yoseop Lim, Jaeseok Park, Sungho Kang

Research output: Contribution to journalLetter

Abstract

The demand for fault diagnosis has increased with the increasing complexity of VLSI devices. Defects that result from process variations may cluster in certain areas. When a large number of defects cluster in an area, diagnosing these defects is a challenging problem because defects frequently exist that are partially or completely dominated by other adjacent defects. The most common approach for modeling delay defects is the transition fault model. We propose a diagnostic method that can handle clusters of transition faults. The experimental results for the full-scan version of the ISCAS'89 benchmark circuits demonstrate the accuracy of the proposed method.

Original languageEnglish
Pages (from-to)1528-1533
Number of pages6
JournalIEICE Electronics Express
Volume9
Issue number19
DOIs
Publication statusPublished - 2012 Nov 19

Fingerprint

Defects
defects
simulation
very large scale integration
Failure analysis
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

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An accurate diagnosis of transition fault clusters based on single fault simulation. / Lim, Yoseop; Park, Jaeseok; Kang, Sungho.

In: IEICE Electronics Express, Vol. 9, No. 19, 19.11.2012, p. 1528-1533.

Research output: Contribution to journalLetter

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