TY - GEN
T1 - An area efficient programmable built-in self-test for embedded memories using an extended address counter
AU - Park, Kihyun
AU - Lee, Joohwan
AU - Kang, Sungho
PY - 2010
Y1 - 2010
N2 - Programmable memory built-in self-tests (BIST) have increased test flexibility but result in large area overhead. In this research, a new finite state machine (FSM) based programmable memory BIST that can select march algorithms was proposed in order to overcome this problem. The proposed BIST efficiently generates various march algorithms utilizing an extended address counter while also taking into consideration the characteristics of the march algorithms. The experimental results of this research indicated that the proposed BIST improved test flexibility and resulted in a smaller area overhead, as compared to the results of previous studies.
AB - Programmable memory built-in self-tests (BIST) have increased test flexibility but result in large area overhead. In this research, a new finite state machine (FSM) based programmable memory BIST that can select march algorithms was proposed in order to overcome this problem. The proposed BIST efficiently generates various march algorithms utilizing an extended address counter while also taking into consideration the characteristics of the march algorithms. The experimental results of this research indicated that the proposed BIST improved test flexibility and resulted in a smaller area overhead, as compared to the results of previous studies.
UR - http://www.scopus.com/inward/record.url?scp=79851500088&partnerID=8YFLogxK
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U2 - 10.1109/SOCDC.2010.5682974
DO - 10.1109/SOCDC.2010.5682974
M3 - Conference contribution
AN - SCOPUS:79851500088
SN - 9781424486335
T3 - 2010 International SoC Design Conference, ISOCC 2010
SP - 59
EP - 62
BT - 2010 International SoC Design Conference, ISOCC 2010
T2 - 2010 International SoC Design Conference, ISOCC 2010
Y2 - 22 November 2010 through 23 November 2010
ER -