An area efficient programmable built-in self-test for embedded memories using an extended address counter

Kihyun Park, Joohwan Lee, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Programmable memory built-in self-tests (BIST) have increased test flexibility but result in large area overhead. In this research, a new finite state machine (FSM) based programmable memory BIST that can select march algorithms was proposed in order to overcome this problem. The proposed BIST efficiently generates various march algorithms utilizing an extended address counter while also taking into consideration the characteristics of the march algorithms. The experimental results of this research indicated that the proposed BIST improved test flexibility and resulted in a smaller area overhead, as compared to the results of previous studies.

Original languageEnglish
Title of host publication2010 International SoC Design Conference, ISOCC 2010
Pages59-62
Number of pages4
DOIs
Publication statusPublished - 2010 Dec 1
Event2010 International SoC Design Conference, ISOCC 2010 - Incheon, Korea, Republic of
Duration: 2010 Nov 222010 Nov 23

Publication series

Name2010 International SoC Design Conference, ISOCC 2010

Other

Other2010 International SoC Design Conference, ISOCC 2010
CountryKorea, Republic of
CityIncheon
Period10/11/2210/11/23

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

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    Park, K., Lee, J., & Kang, S. (2010). An area efficient programmable built-in self-test for embedded memories using an extended address counter. In 2010 International SoC Design Conference, ISOCC 2010 (pp. 59-62). [5682974] (2010 International SoC Design Conference, ISOCC 2010). https://doi.org/10.1109/SOCDC.2010.5682974