An effective built-in self-test for chargepump PLL

Junseok Han, Dongsup Song, Hagbae Kim, Youngyong Kim, Sungho Kang

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.

Original languageEnglish
Pages (from-to)1731-1733
Number of pages3
JournalIEICE Transactions on Electronics
Issue number8
Publication statusPublished - 2005 Aug

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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