An effective built-in self-test for chargepump PLL

Junseok Han; Dongsup Song; Hagbae Kim; Youngyong Kim; Sungho Kang

doi:10.1093/ietele/e88-c.8.1731

An effective built-in self-test for chargepump PLL

Junseok Han, Dongsup Song, Hagbae Kim, Youngyong Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.

Original language	English
Pages (from-to)	1731-1733
Number of pages	3
Journal	IEICE Transactions on Electronics
Volume	E88-C
Issue number	8
DOIs	https://doi.org/10.1093/ietele/e88-c.8.1731
Publication status	Published - 2005 Aug

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1093/ietele/e88-c.8.1731

Cite this

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AB - In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.

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An effective built-in self-test for chargepump PLL

Abstract

All Science Journal Classification (ASJC) codes

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