An effective built-in self-test for chargepump PLL

Junseok Han, Dongsup Song, Hagbae Kim, Young Yong Kim, Sungho Kang

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.

Original languageEnglish
Pages (from-to)1731-1733
Number of pages3
JournalIEICE Transactions on Electronics
VolumeE88-C
Issue number8
DOIs
Publication statusPublished - 2005 Jan 1

Fingerprint

Built-in self test
Phase locked loops
Feedback
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Han, Junseok ; Song, Dongsup ; Kim, Hagbae ; Kim, Young Yong ; Kang, Sungho. / An effective built-in self-test for chargepump PLL. In: IEICE Transactions on Electronics. 2005 ; Vol. E88-C, No. 8. pp. 1731-1733.
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An effective built-in self-test for chargepump PLL. / Han, Junseok; Song, Dongsup; Kim, Hagbae; Kim, Young Yong; Kang, Sungho.

In: IEICE Transactions on Electronics, Vol. E88-C, No. 8, 01.01.2005, p. 1731-1733.

Research output: Contribution to journalArticle

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