In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering