An effective hybrid test data compression method using scan chain compaction and dictionary-based scheme

Taejin Kim, Sunghoon Chun, Yongjoon Kim, Myung Hoon Yang, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

In this paper, we propose a new test data compression method for reducing test data volume and test application time. The proposed method consists of two steps: scan chain compaction and dictionary-based compression scheme. The scan chain compaction provides a minimum scan chain depth by using compaction of the compatible scan cells in the scan chain. The compacted scan chain is partitioned to the multiple internal scan chains for using the fixed-length index dictionary-based compression scheme that provides the high compression ratio and the fast testing time. The proposed compression method delivers compressed patterns from the ATE to the chip and drives a large number of multiple internal scan chains using only a single ATE input and output. Experimental results for the ISCAS-89 test benches show that the test data volume and testing time for the proposed method are less than previous compression schemes.

Original languageEnglish
Title of host publicationProceedings of the 17th Asian Test Symposium, ATS 2008
Pages151-156
Number of pages6
DOIs
Publication statusPublished - 2008 Dec 1
Event17th Asian Test Symposium, ATS 2008 - Sapporo, Japan
Duration: 2008 Nov 242008 Nov 27

Other

Other17th Asian Test Symposium, ATS 2008
CountryJapan
CitySapporo
Period08/11/2408/11/27

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Kim, T., Chun, S., Kim, Y., Yang, M. H., & Kang, S. (2008). An effective hybrid test data compression method using scan chain compaction and dictionary-based scheme. In Proceedings of the 17th Asian Test Symposium, ATS 2008 (pp. 151-156). [4711575] https://doi.org/10.1109/ATS.2008.58