An effective programmable memory BIST for embedded memory

Youngkyu Park; Jaeseok Park; Taewoo Han; Sungho Kang

doi:10.1587/transinf.E92.D.2508

An effective programmable memory BIST for embedded memory

Youngkyu Park, Jaeseok Park, Taewoo Han, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

This paper proposes a micro-code based Programmable Memory BIST (PMBIST) architecture that can support various kinds of test algorithms. The proposed Non-linear PMBIST (NPMBIST) guarantees high flexibility and high fault coverage using not onlyMarch algorithms but also non-linear algorithms such asWalking and Galloping. This NPMBIST has an optimized hardware overhead, since algorithms can be implemented with the minimum bits by the optimized instructions. Finally various and complex algorithms can be run thanks to its support of multi-loop.

Original language	English
Pages (from-to)	2508-2511
Number of pages	4
Journal	IEICE Transactions on Information and Systems
Volume	E92-D
Issue number	12
DOIs	https://doi.org/10.1587/transinf.E92.D.2508
Publication status	Published - 2009

All Science Journal Classification (ASJC) codes

Software
Hardware and Architecture
Computer Vision and Pattern Recognition
Electrical and Electronic Engineering
Artificial Intelligence

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