An effective programmable memory BIST for embedded memory

Youngkyu Park, Jaeseok Park, Taewoo Han, Sungho Kang

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

This paper proposes a micro-code based Programmable Memory BIST (PMBIST) architecture that can support various kinds of test algorithms. The proposed Non-linear PMBIST (NPMBIST) guarantees high flexibility and high fault coverage using not onlyMarch algorithms but also non-linear algorithms such asWalking and Galloping. This NPMBIST has an optimized hardware overhead, since algorithms can be implemented with the minimum bits by the optimized instructions. Finally various and complex algorithms can be run thanks to its support of multi-loop.

Original languageEnglish
Pages (from-to)2508-2511
Number of pages4
JournalIEICE Transactions on Information and Systems
VolumeE92-D
Issue number12
DOIs
Publication statusPublished - 2009

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence

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