TY - GEN
T1 - An effective test pattern generation for testing signal integrity
AU - Kim, Yongjoon
AU - Yang, Myung Hoon
AU - Park, Youngkyu
AU - Lee, Dae Yeal
AU - Kang, Sungho
PY - 2006
Y1 - 2006
N2 - As more cores are integrated in a single chip with sophisticated process like nano technology, testing signal integrity between the cores needs much effort due to complicate coupling effects. In this paper, we propose a novel test pattern generation method for testing signal integrity. Using this method, short and effective test patterns are generated with low hardware overhead. It can be used for self-test scheme and experimental results show the effectiveness of the proposed scheme.
AB - As more cores are integrated in a single chip with sophisticated process like nano technology, testing signal integrity between the cores needs much effort due to complicate coupling effects. In this paper, we propose a novel test pattern generation method for testing signal integrity. Using this method, short and effective test patterns are generated with low hardware overhead. It can be used for self-test scheme and experimental results show the effectiveness of the proposed scheme.
UR - http://www.scopus.com/inward/record.url?scp=33947634054&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33947634054&partnerID=8YFLogxK
U2 - 10.1109/ATS.2006.261032
DO - 10.1109/ATS.2006.261032
M3 - Conference contribution
AN - SCOPUS:33947634054
SN - 0769526284
SN - 9780769526287
T3 - Proceedings of the Asian Test Symposium
SP - 279
EP - 284
BT - Proceedings of the 15th Asian Test Symposium 2006
T2 - 15th Asian Test Symposium 2006
Y2 - 20 November 2006 through 23 November 2006
ER -