An effective test pattern generation for testing signal integrity

Yongjoon Kim, Myung Hoon Yang, Youngkyu Park, Dae Yeal Lee, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

As more cores are integrated in a single chip with sophisticated process like nano technology, testing signal integrity between the cores needs much effort due to complicate coupling effects. In this paper, we propose a novel test pattern generation method for testing signal integrity. Using this method, short and effective test patterns are generated with low hardware overhead. It can be used for self-test scheme and experimental results show the effectiveness of the proposed scheme.

Original languageEnglish
Title of host publicationProceedings of the 15th Asian Test Symposium 2006
Pages279-284
Number of pages6
DOIs
Publication statusPublished - 2006 Dec 1
Event15th Asian Test Symposium 2006 - Fukuoka, Japan
Duration: 2006 Nov 202006 Nov 23

Publication series

NameProceedings of the Asian Test Symposium
Volume2006
ISSN (Print)1081-7735

Other

Other15th Asian Test Symposium 2006
CountryJapan
CityFukuoka
Period06/11/2006/11/23

Fingerprint

Testing
Nanotechnology
Hardware

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Kim, Y., Yang, M. H., Park, Y., Lee, D. Y., & Kang, S. (2006). An effective test pattern generation for testing signal integrity. In Proceedings of the 15th Asian Test Symposium 2006 (pp. 279-284). [4030780] (Proceedings of the Asian Test Symposium; Vol. 2006). https://doi.org/10.1109/ATS.2006.261032
Kim, Yongjoon ; Yang, Myung Hoon ; Park, Youngkyu ; Lee, Dae Yeal ; Kang, Sungho. / An effective test pattern generation for testing signal integrity. Proceedings of the 15th Asian Test Symposium 2006. 2006. pp. 279-284 (Proceedings of the Asian Test Symposium).
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Kim, Y, Yang, MH, Park, Y, Lee, DY & Kang, S 2006, An effective test pattern generation for testing signal integrity. in Proceedings of the 15th Asian Test Symposium 2006., 4030780, Proceedings of the Asian Test Symposium, vol. 2006, pp. 279-284, 15th Asian Test Symposium 2006, Fukuoka, Japan, 06/11/20. https://doi.org/10.1109/ATS.2006.261032

An effective test pattern generation for testing signal integrity. / Kim, Yongjoon; Yang, Myung Hoon; Park, Youngkyu; Lee, Dae Yeal; Kang, Sungho.

Proceedings of the 15th Asian Test Symposium 2006. 2006. p. 279-284 4030780 (Proceedings of the Asian Test Symposium; Vol. 2006).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Kim Y, Yang MH, Park Y, Lee DY, Kang S. An effective test pattern generation for testing signal integrity. In Proceedings of the 15th Asian Test Symposium 2006. 2006. p. 279-284. 4030780. (Proceedings of the Asian Test Symposium). https://doi.org/10.1109/ATS.2006.261032