An effective test pattern generation for testing signal integrity

Yongjoon Kim, Myung Hoon Yang, Youngkyu Park, Dae Yeal Lee, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

As more cores are integrated in a single chip with sophisticated process like nano technology, testing signal integrity between the cores needs much effort due to complicate coupling effects. In this paper, we propose a novel test pattern generation method for testing signal integrity. Using this method, short and effective test patterns are generated with low hardware overhead. It can be used for self-test scheme and experimental results show the effectiveness of the proposed scheme.

Original languageEnglish
Title of host publicationProceedings of the 15th Asian Test Symposium 2006
Pages279-284
Number of pages6
DOIs
Publication statusPublished - 2006 Dec 1
Event15th Asian Test Symposium 2006 - Fukuoka, Japan
Duration: 2006 Nov 202006 Nov 23

Publication series

NameProceedings of the Asian Test Symposium
Volume2006
ISSN (Print)1081-7735

Other

Other15th Asian Test Symposium 2006
CountryJapan
CityFukuoka
Period06/11/2006/11/23

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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  • Cite this

    Kim, Y., Yang, M. H., Park, Y., Lee, D. Y., & Kang, S. (2006). An effective test pattern generation for testing signal integrity. In Proceedings of the 15th Asian Test Symposium 2006 (pp. 279-284). [4030780] (Proceedings of the Asian Test Symposium; Vol. 2006). https://doi.org/10.1109/ATS.2006.261032