An efficient all-digital built-in self-test for chargepump PLL

Junseok Han, Dongsup Song, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

Analog and mixed-signal testing is becomming an important issue that affects both the time-to-market and product cost of many SoCs. In order to provide an efficient test method for the PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. It uses the change of phase differences generated by selectively alternating the feedback frequency. This BIST can be easily implemented with several counters and combinational logic gates. The simulation results show higher fault coverage than that of previous test methods. Thus it provides an efficient structural test, which is suitable for a production test in terms of an area overhead, a test accessibility, and test time.

Original languageEnglish
Title of host publicationProceedings of 2004 IEEE Asia-Pacific Conference on Advanced System Integrated Circuits
Pages80-83
Number of pages4
Publication statusPublished - 2004
EventProceedings of 2004 IEEE Asia-Pacific Conference on Advanced System Integrated Circuits - Fukuoka, Japan
Duration: 2004 Aug 42004 Aug 5

Publication series

NameProceedings of 2004 IEEE Asia-Pacific Conference on Advanced System Integrated Circuits

Other

OtherProceedings of 2004 IEEE Asia-Pacific Conference on Advanced System Integrated Circuits
CountryJapan
CityFukuoka
Period04/8/404/8/5

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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