An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

Hyeonchan Lim, Seokjun Jang, Seunghwan Kim, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scan-based test and diagnosis are important for improving yield of nanometer-scale chips. However, the scan chain can be subject to defects due to large hardware incurred by itself, which accounts for considerable portion of total chip area. Hence, scan chain test and diagnosis has played a critical role in recent years. In this paper, an efficient scan chain diagnosis method is proposed for not only stuck-at fault but also transition fault. The proposed method is implemented simply and provides maximum diagnosis resolution for stuck-at and transition faults.

Original languageEnglish
Title of host publicationProceedings - 2019 International SoC Design Conference, ISOCC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages295-296
Number of pages2
ISBN (Electronic)9781728124780
DOIs
Publication statusPublished - 2019 Oct
Event16th International System-on-Chip Design Conference, ISOCC 2019 - Jeju, Korea, Republic of
Duration: 2019 Oct 62019 Oct 9

Publication series

NameProceedings - 2019 International SoC Design Conference, ISOCC 2019
Volume2019-January

Conference

Conference16th International System-on-Chip Design Conference, ISOCC 2019
CountryKorea, Republic of
CityJeju
Period19/10/619/10/9

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Electrical and Electronic Engineering
  • Instrumentation
  • Artificial Intelligence
  • Hardware and Architecture

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  • Cite this

    Lim, H., Jang, S., Kim, S., & Kang, S. (2019). An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults. In Proceedings - 2019 International SoC Design Conference, ISOCC 2019 (pp. 295-296). [9078517] (Proceedings - 2019 International SoC Design Conference, ISOCC 2019; Vol. 2019-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC47750.2019.9078517