An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

Hyeonchan Lim; Seokjun Jang; Seunghwan Kim; Sungho Kang

doi:10.1109/ISOCC47750.2019.9078517

An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

Hyeonchan Lim, Seokjun Jang, Seunghwan Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Scan-based test and diagnosis are important for improving yield of nanometer-scale chips. However, the scan chain can be subject to defects due to large hardware incurred by itself, which accounts for considerable portion of total chip area. Hence, scan chain test and diagnosis has played a critical role in recent years. In this paper, an efficient scan chain diagnosis method is proposed for not only stuck-at fault but also transition fault. The proposed method is implemented simply and provides maximum diagnosis resolution for stuck-at and transition faults.

Original language	English
Title of host publication	Proceedings - 2019 International SoC Design Conference, ISOCC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	295-296
Number of pages	2
ISBN (Electronic)	9781728124780
DOIs	https://doi.org/10.1109/ISOCC47750.2019.9078517
Publication status	Published - 2019 Oct
Event	16th International System-on-Chip Design Conference, ISOCC 2019 - Jeju, Korea, Republic of Duration: 2019 Oct 6 → 2019 Oct 9

Publication series

Name	Proceedings - 2019 International SoC Design Conference, ISOCC 2019
Volume	2019-January

Conference

Conference	16th International System-on-Chip Design Conference, ISOCC 2019
Country/Territory	Korea, Republic of
City	Jeju
Period	19/10/6 → 19/10/9

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported by Samsung Electronics Company, Ltd., Hwasung, Korea.

Publisher Copyright:
© 2019 IEEE.

All Science Journal Classification (ASJC) codes

Signal Processing
Electrical and Electronic Engineering
Instrumentation
Artificial Intelligence
Hardware and Architecture

Access to Document

10.1109/ISOCC47750.2019.9078517

Cite this

Lim, H., Jang, S., Kim, S., & Kang, S. (2019). An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults. In Proceedings - 2019 International SoC Design Conference, ISOCC 2019 (pp. 295-296). [9078517] (Proceedings - 2019 International SoC Design Conference, ISOCC 2019; Vol. 2019-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC47750.2019.9078517

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abstract = "Scan-based test and diagnosis are important for improving yield of nanometer-scale chips. However, the scan chain can be subject to defects due to large hardware incurred by itself, which accounts for considerable portion of total chip area. Hence, scan chain test and diagnosis has played a critical role in recent years. In this paper, an efficient scan chain diagnosis method is proposed for not only stuck-at fault but also transition fault. The proposed method is implemented simply and provides maximum diagnosis resolution for stuck-at and transition faults.",

author = "Hyeonchan Lim and Seokjun Jang and Seunghwan Kim and Sungho Kang",

note = "Funding Information: ACKNOWLEDGMENT This work was supported by Samsung Electronics Company, Ltd., Hwasung, Korea. Publisher Copyright: {\textcopyright} 2019 IEEE.; 16th International System-on-Chip Design Conference, ISOCC 2019 ; Conference date: 06-10-2019 Through 09-10-2019",

year = "2019",

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doi = "10.1109/ISOCC47750.2019.9078517",

language = "English",

series = "Proceedings - 2019 International SoC Design Conference, ISOCC 2019",

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Lim, H, Jang, S, Kim, S & Kang, S 2019, An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults. in Proceedings - 2019 International SoC Design Conference, ISOCC 2019., 9078517, Proceedings - 2019 International SoC Design Conference, ISOCC 2019, vol. 2019-January, Institute of Electrical and Electronics Engineers Inc., pp. 295-296, 16th International System-on-Chip Design Conference, ISOCC 2019, Jeju, Korea, Republic of, 19/10/6. https://doi.org/10.1109/ISOCC47750.2019.9078517

An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults. / Lim, Hyeonchan; Jang, Seokjun; Kim, Seunghwan et al.

Proceedings - 2019 International SoC Design Conference, ISOCC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 295-296 9078517 (Proceedings - 2019 International SoC Design Conference, ISOCC 2019; Vol. 2019-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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N2 - Scan-based test and diagnosis are important for improving yield of nanometer-scale chips. However, the scan chain can be subject to defects due to large hardware incurred by itself, which accounts for considerable portion of total chip area. Hence, scan chain test and diagnosis has played a critical role in recent years. In this paper, an efficient scan chain diagnosis method is proposed for not only stuck-at fault but also transition fault. The proposed method is implemented simply and provides maximum diagnosis resolution for stuck-at and transition faults.

AB - Scan-based test and diagnosis are important for improving yield of nanometer-scale chips. However, the scan chain can be subject to defects due to large hardware incurred by itself, which accounts for considerable portion of total chip area. Hence, scan chain test and diagnosis has played a critical role in recent years. In this paper, an efficient scan chain diagnosis method is proposed for not only stuck-at fault but also transition fault. The proposed method is implemented simply and provides maximum diagnosis resolution for stuck-at and transition faults.

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M3 - Conference contribution

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BT - Proceedings - 2019 International SoC Design Conference, ISOCC 2019

PB - Institute of Electrical and Electronics Engineers Inc.

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An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

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