An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

Hyeonchan Lim, Seokjun Jang, Seunghwan Kim, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint Dive into the research topics of 'An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science