An efficient scan chain diagnosis method using a new symbolic simulation

Chun Sunghoon, Kim Yongjoon, Kim Taejin, Kang Sungho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)


Locating the scan chain faults is very important for dedicated IC manufacturers to guide the failure analysis process for yield improvement. In this paper, we propose a new symbolic simulation based scan chain diagnosis method to solve the scan chain diagnosis resolution problem as well as the multiple faults problem. The proposed method uses a new symbolic simulation with the faulty probabilities of a set of candidate faulty scan cells in a bounded range and to analyze the effects caused by faulty scan cells in good scan chains. In addition, we use the faulty information in good scan chains that are not contaminated by the faults while unloading scan out responses. In addition, a new score matching method is proposed to effectively handle multiple faults and to improve the diagnostic resolution by ranking the candidate scan cells in the candidate list. Experimental results demonstrate the effectiveness of the proposed method.

Original languageEnglish
Title of host publicationProceedings - 26th IEEE VLSI Test Symposium, VTS08
Number of pages6
Publication statusPublished - 2008
Event26th IEEE VLSI Test Symposium, VTS08 - San Diego, CA, United States
Duration: 2008 Apr 272008 May 1

Publication series

NameProceedings of the IEEE VLSI Test Symposium


Other26th IEEE VLSI Test Symposium, VTS08
Country/TerritoryUnited States
CitySan Diego, CA

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering


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