An efficient scan chain diagnosis method using a new symbolic simulation

Chun Sunghoon, Kim Yongjoon, Kim Taejin, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Locating the scan chain faults is very important for dedicated IC manufacturers to guide the failure analysis process for yield improvement. In this paper, we propose a new symbolic simulation based scan chain diagnosis method to solve the scan chain diagnosis resolution problem as well as the multiple faults problem. The proposed method uses a new symbolic simulation with the faulty probabilities of a set of candidate faulty scan cells in a bounded range and to analyze the effects caused by faulty scan cells in good scan chains. In addition, we use the faulty information in good scan chains that are not contaminated by the faults while unloading scan out responses. In addition, a new score matching method is proposed to effectively handle multiple faults and to improve the diagnostic resolution by ranking the candidate scan cells in the candidate list. Experimental results demonstrate the effectiveness of the proposed method.

Original languageEnglish
Title of host publicationProceedings - 26th IEEE VLSI Test Symposium, VTS08
Pages73-78
Number of pages6
DOIs
Publication statusPublished - 2008 Sep 16
Event26th IEEE VLSI Test Symposium, VTS08 - San Diego, CA, United States
Duration: 2008 Apr 272008 May 1

Publication series

NameProceedings of the IEEE VLSI Test Symposium

Other

Other26th IEEE VLSI Test Symposium, VTS08
CountryUnited States
CitySan Diego, CA
Period08/4/2708/5/1

Fingerprint

Unloading
Failure analysis

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Sunghoon, C., Yongjoon, K., Taejin, K., & Kang, S. (2008). An efficient scan chain diagnosis method using a new symbolic simulation. In Proceedings - 26th IEEE VLSI Test Symposium, VTS08 (pp. 73-78). [4511699] (Proceedings of the IEEE VLSI Test Symposium). https://doi.org/10.1109/VTS.2008.61
Sunghoon, Chun ; Yongjoon, Kim ; Taejin, Kim ; Kang, Sungho. / An efficient scan chain diagnosis method using a new symbolic simulation. Proceedings - 26th IEEE VLSI Test Symposium, VTS08. 2008. pp. 73-78 (Proceedings of the IEEE VLSI Test Symposium).
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Sunghoon, C, Yongjoon, K, Taejin, K & Kang, S 2008, An efficient scan chain diagnosis method using a new symbolic simulation. in Proceedings - 26th IEEE VLSI Test Symposium, VTS08., 4511699, Proceedings of the IEEE VLSI Test Symposium, pp. 73-78, 26th IEEE VLSI Test Symposium, VTS08, San Diego, CA, United States, 08/4/27. https://doi.org/10.1109/VTS.2008.61

An efficient scan chain diagnosis method using a new symbolic simulation. / Sunghoon, Chun; Yongjoon, Kim; Taejin, Kim; Kang, Sungho.

Proceedings - 26th IEEE VLSI Test Symposium, VTS08. 2008. p. 73-78 4511699 (Proceedings of the IEEE VLSI Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Sunghoon C, Yongjoon K, Taejin K, Kang S. An efficient scan chain diagnosis method using a new symbolic simulation. In Proceedings - 26th IEEE VLSI Test Symposium, VTS08. 2008. p. 73-78. 4511699. (Proceedings of the IEEE VLSI Test Symposium). https://doi.org/10.1109/VTS.2008.61