An empirical analysis of effect factors for high reliability on AMOLED display

Hojoong Kim, Chanhyuk Jung, Jang Yeon Kwon, Songkuk Kim

Research output: Contribution to journalConference article

Abstract

A luminance degradation of AMOLED display is analyzed in order to figure out driving factors for high performance of reliability on a large-scaled display. The initial non-uniformity and ageing parameters were incorporated into the luminance decay model For each set of parameters, we simulated the luminance degradation of 10, 000 panels for 100, 000 operating hours and analyzed by two criteria; contrast deviation and luminance variation of panels to determine failures. Stability of TFTs is the most significant parameter for realizing highly reliable AMOLED display. Stability of OLEDs is also potential factor when which of TFTs is sufficient.

Original languageEnglish
Pages (from-to)114-117
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume46
Issue numberBook 1
Publication statusPublished - 2015 Jun 1
Event2015 SID International Symposium - San Jose, United States
Duration: 2015 Jun 22015 Jun 3

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Luminance
Display devices
Degradation
Organic light emitting diodes (OLED)
Aging of materials

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

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An empirical analysis of effect factors for high reliability on AMOLED display. / Kim, Hojoong; Jung, Chanhyuk; Kwon, Jang Yeon; Kim, Songkuk.

In: Digest of Technical Papers - SID International Symposium, Vol. 46, No. Book 1, 01.06.2015, p. 114-117.

Research output: Contribution to journalConference article

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