An online test and debug methodology for automotive image processing system

Hyunggoy Oh, Inhyuk Choi, Taewoo Han, Won Jung, Byungin Moon, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In the digital system where safety is a major issue, the reliability issue has been more important. However, as the circuit design has been more complicated, the number of some errors which escaped from the pre-silicon verification has been increased and the undetected errors have a bad influence upon reliability. To solve this problem, an online test and debug methodology for the automotive image processing system is proposed in this paper. Experimental results show the proposed methodology has high system reliability and provides the concurrent operation with a negligible test time and a small hardware overhead compared to the previous works.

Original languageEnglish
Title of host publicationISOCC 2014 - International SoC Design Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages226-227
Number of pages2
ISBN (Electronic)9781479951260
DOIs
Publication statusPublished - 2015 Apr 16
Event11th International SoC Design Conference, ISOCC 2014 - Jeju, Korea, Republic of
Duration: 2014 Nov 32014 Nov 6

Publication series

NameISOCC 2014 - International SoC Design Conference

Other

Other11th International SoC Design Conference, ISOCC 2014
CountryKorea, Republic of
CityJeju
Period14/11/314/11/6

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

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    Oh, H., Choi, I., Han, T., Jung, W., Moon, B., & Kang, S. (2015). An online test and debug methodology for automotive image processing system. In ISOCC 2014 - International SoC Design Conference (pp. 226-227). [7087618] (ISOCC 2014 - International SoC Design Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2014.7087618