An optimized test sequence satisfying the completeness criteria

Hongse Son, Daehun Nyang, Sangyong Lim, Jinho Park, Young Han Choe, Byungmun Chin, Jooseok Song

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.

Original languageEnglish
Title of host publicationProceedings - 12th International Conference on Information Networking, ICOIN 1998
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages621-625
Number of pages5
ISBN (Electronic)0818672250, 9780818672255
DOIs
Publication statusPublished - 1998 Jan 1
Event12th International Conference on Information Networking, ICOIN 1998 - Koganei, Tokyo, Japan
Duration: 1998 Jan 211998 Jan 23

Publication series

NameProceedings - 12th International Conference on Information Networking, ICOIN 1998

Conference

Conference12th International Conference on Information Networking, ICOIN 1998
CountryJapan
CityKoganei, Tokyo
Period98/1/2198/1/23

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Information Systems

Cite this

Son, H., Nyang, D., Lim, S., Park, J., Choe, Y. H., Chin, B., & Song, J. (1998). An optimized test sequence satisfying the completeness criteria. In Proceedings - 12th International Conference on Information Networking, ICOIN 1998 (pp. 621-625). (Proceedings - 12th International Conference on Information Networking, ICOIN 1998). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICOIN.1998.648477
Son, Hongse ; Nyang, Daehun ; Lim, Sangyong ; Park, Jinho ; Choe, Young Han ; Chin, Byungmun ; Song, Jooseok. / An optimized test sequence satisfying the completeness criteria. Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Institute of Electrical and Electronics Engineers Inc., 1998. pp. 621-625 (Proceedings - 12th International Conference on Information Networking, ICOIN 1998).
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author = "Hongse Son and Daehun Nyang and Sangyong Lim and Jinho Park and Choe, {Young Han} and Byungmun Chin and Jooseok Song",
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Son, H, Nyang, D, Lim, S, Park, J, Choe, YH, Chin, B & Song, J 1998, An optimized test sequence satisfying the completeness criteria. in Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Proceedings - 12th International Conference on Information Networking, ICOIN 1998, Institute of Electrical and Electronics Engineers Inc., pp. 621-625, 12th International Conference on Information Networking, ICOIN 1998, Koganei, Tokyo, Japan, 98/1/21. https://doi.org/10.1109/ICOIN.1998.648477

An optimized test sequence satisfying the completeness criteria. / Son, Hongse; Nyang, Daehun; Lim, Sangyong; Park, Jinho; Choe, Young Han; Chin, Byungmun; Song, Jooseok.

Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Institute of Electrical and Electronics Engineers Inc., 1998. p. 621-625 (Proceedings - 12th International Conference on Information Networking, ICOIN 1998).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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N2 - We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.

AB - We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.

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Son H, Nyang D, Lim S, Park J, Choe YH, Chin B et al. An optimized test sequence satisfying the completeness criteria. In Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Institute of Electrical and Electronics Engineers Inc. 1998. p. 621-625. (Proceedings - 12th International Conference on Information Networking, ICOIN 1998). https://doi.org/10.1109/ICOIN.1998.648477