Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)

Sucbei Moon, Youngjae Won, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity of a decaying fluorescence light source is acquired as an analog waveform, and the lifetime information of the source is extracted from the calculated mean temporal delay of the waveform.

Original languageEnglish
Title of host publication2009 International Conference on Optical Instruments and Technology - Optical Systems and Modern Optoelectronic Instruments
DOIs
Publication statusPublished - 2009 Dec 1
Event2009 International Conference on Optical Instruments and Technology, OIT 2009 - Shanghai, China
Duration: 2009 Oct 192009 Oct 22

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7506
ISSN (Print)0277-786X

Other

Other2009 International Conference on Optical Instruments and Technology, OIT 2009
CountryChina
CityShanghai
Period09/10/1909/10/22

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Moon, S., Won, Y., & Kim, D. Y. (2009). Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM). In 2009 International Conference on Optical Instruments and Technology - Optical Systems and Modern Optoelectronic Instruments [750605] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7506). https://doi.org/10.1117/12.848242