Abstract
We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity signal of a fluorescence decay is acquired as an analog waveform. And the lifetime information is extracted from the mean temporal delay of the acquired signal. Since this method does not rely on the single-photon counting technique, the signals of multiple fluorescence photons can be acquired simultaneously. The measurement speed can be increased easily by raising the fluorescence intensity without a photon-rate limit. We have investigated various characteristics of our method in lifetime accuracy and precision as well as measurement speed. It has been found that our method can provide excellent measurement performances in various aspects. We have demonstrated a high-speed measurement with a high photon detection rate of ∼108 photons per second with a nearly shot noise-limited photon economy. A fluorescence lifetime of 3.2 ns was accurately determined with a standard deviation of 3% from the data acquired within 17.8 μs at a rate of 56,300 lifetime determinations per second.
| Original language | English |
|---|---|
| Pages (from-to) | 2834-2849 |
| Number of pages | 16 |
| Journal | Optics Express |
| Volume | 17 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2009 Feb 16 |
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All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
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Analog mean-delay method for high-speed fluorescence lifetime measurement. / Moon, Sucbei; Won, Youngjae; Kim, Dug Young.
In: Optics Express, Vol. 17, No. 4, 16.02.2009, p. 2834-2849.Research output: Contribution to journal › Article
TY - JOUR
T1 - Analog mean-delay method for high-speed fluorescence lifetime measurement
AU - Moon, Sucbei
AU - Won, Youngjae
AU - Kim, Dug Young
PY - 2009/2/16
Y1 - 2009/2/16
N2 - We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity signal of a fluorescence decay is acquired as an analog waveform. And the lifetime information is extracted from the mean temporal delay of the acquired signal. Since this method does not rely on the single-photon counting technique, the signals of multiple fluorescence photons can be acquired simultaneously. The measurement speed can be increased easily by raising the fluorescence intensity without a photon-rate limit. We have investigated various characteristics of our method in lifetime accuracy and precision as well as measurement speed. It has been found that our method can provide excellent measurement performances in various aspects. We have demonstrated a high-speed measurement with a high photon detection rate of ∼108 photons per second with a nearly shot noise-limited photon economy. A fluorescence lifetime of 3.2 ns was accurately determined with a standard deviation of 3% from the data acquired within 17.8 μs at a rate of 56,300 lifetime determinations per second.
AB - We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity signal of a fluorescence decay is acquired as an analog waveform. And the lifetime information is extracted from the mean temporal delay of the acquired signal. Since this method does not rely on the single-photon counting technique, the signals of multiple fluorescence photons can be acquired simultaneously. The measurement speed can be increased easily by raising the fluorescence intensity without a photon-rate limit. We have investigated various characteristics of our method in lifetime accuracy and precision as well as measurement speed. It has been found that our method can provide excellent measurement performances in various aspects. We have demonstrated a high-speed measurement with a high photon detection rate of ∼108 photons per second with a nearly shot noise-limited photon economy. A fluorescence lifetime of 3.2 ns was accurately determined with a standard deviation of 3% from the data acquired within 17.8 μs at a rate of 56,300 lifetime determinations per second.
UR - http://www.scopus.com/inward/record.url?scp=60549098441&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=60549098441&partnerID=8YFLogxK
U2 - 10.1364/OE.17.002834
DO - 10.1364/OE.17.002834
M3 - Article
C2 - 19219188
AN - SCOPUS:60549098441
VL - 17
SP - 2834
EP - 2849
JO - Optics Express
JF - Optics Express
SN - 1094-4087
IS - 4
ER -