Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method

Wonsang Hwang, Dongeun Kim, Seungrag Lee, Young Jae Won, Sucbei Moon, Dug Young Kim

Research output: Contribution to journalArticle

Abstract

Signals obtained in fluorescence lifetime imaging microscopy (FLIM) often contain biexponential decay components, and unmixing of them is a critical issue in FLIM especially for fluorescence resonance-energy-transfer (FRET) applications. Even though the analog mean-delay (AMD) method is the fastest fluorescence lifetime measurement scheme for point-scanning confocal microscopy, its ability to analyze biexponential decay signals has not been demonstrated, yet. In this paper we have demonstrated that biexponential decay signals can be effectively analyzed with the AMD method. Effects of various measurement conditions on the accuracy of biexponential decay signal analysis are presented with numerical simulations and experimental demonstrations.

Original languageEnglish
Pages (from-to)136-143
Number of pages8
JournalOptics Communications
Volume443
DOIs
Publication statusPublished - 2019 Jul 15

Fingerprint

Fluorescence
analogs
life (durability)
fluorescence
Microscopic examination
decay
microscopy
Imaging techniques
Confocal microscopy
Signal analysis
signal analysis
Demonstrations
resonance fluorescence
Scanning
energy transfer
Computer simulation
scanning
simulation
Fluorescence Resonance Energy Transfer

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

Cite this

Hwang, Wonsang ; Kim, Dongeun ; Lee, Seungrag ; Won, Young Jae ; Moon, Sucbei ; Kim, Dug Young. / Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method. In: Optics Communications. 2019 ; Vol. 443. pp. 136-143.
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Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method. / Hwang, Wonsang; Kim, Dongeun; Lee, Seungrag; Won, Young Jae; Moon, Sucbei; Kim, Dug Young.

In: Optics Communications, Vol. 443, 15.07.2019, p. 136-143.

Research output: Contribution to journalArticle

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