Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method

Wonsang Hwang, Dongeun Kim, Seungrag Lee, Young Jae Won, Sucbei Moon, Dug Young Kim

Research output: Contribution to journalArticle

Abstract

Signals obtained in fluorescence lifetime imaging microscopy (FLIM) often contain biexponential decay components, and unmixing of them is a critical issue in FLIM especially for fluorescence resonance-energy-transfer (FRET) applications. Even though the analog mean-delay (AMD) method is the fastest fluorescence lifetime measurement scheme for point-scanning confocal microscopy, its ability to analyze biexponential decay signals has not been demonstrated, yet. In this paper we have demonstrated that biexponential decay signals can be effectively analyzed with the AMD method. Effects of various measurement conditions on the accuracy of biexponential decay signal analysis are presented with numerical simulations and experimental demonstrations.

Original languageEnglish
Pages (from-to)136-143
Number of pages8
JournalOptics Communications
Volume443
DOIs
Publication statusPublished - 2019 Jul 15

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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