Analysis of Intrinsic Charge Loss Mechanisms for Nanoscale NAND Flash Memory

Jun Yeong Lim, Pyung Moon, Sang Myung Lee, Keum Whan Noh, Tae Un Youn, Jong Wook Kim, Ilgu Yun

Research output: Contribution to journalArticle

1 Citation (Scopus)

Fingerprint Dive into the research topics of 'Analysis of Intrinsic Charge Loss Mechanisms for Nanoscale NAND Flash Memory'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science