Analysis of Key Factors for High Yield AMOLED Display

Hojoong Kim, Chanhyuk Jung, Jang Yeon Kwon, Songkuk Kim

Research output: Contribution to journalArticle

Abstract

To figure out the key factors of the reliability of AMOLED displays, we analyzed the luminance degradation based on a large-scale simulation. The initial non-uniformity and aging parameters were incorporated into the luminance decay model. For each set of parameters, we simulated the luminance degradation of 10,000 panels for 100,000 operating hours and analyzed by two criteria; contrast deviation and luminance variation of panels to determine failures. Stability of TFTs is the most significant parameter for realizing highly reliable AMOLED display. Stability of OLEDs is also potential factor when which of TFTs is sufficient.

Original languageEnglish
Article number7154401
Pages (from-to)783-787
Number of pages5
JournalIEEE/OSA Journal of Display Technology
Volume11
Issue number9
DOIs
Publication statusPublished - 2015 Sep 1

Fingerprint

luminance
Luminance
Display devices
degradation
Degradation
Organic light emitting diodes (OLED)
nonuniformity
Aging of materials
deviation
decay
simulation

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

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Analysis of Key Factors for High Yield AMOLED Display. / Kim, Hojoong; Jung, Chanhyuk; Kwon, Jang Yeon; Kim, Songkuk.

In: IEEE/OSA Journal of Display Technology, Vol. 11, No. 9, 7154401, 01.09.2015, p. 783-787.

Research output: Contribution to journalArticle

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