Analysis of L/UL characteristics using numerical model and measurement of lateral velocity profiles

Kyoung Su Park, Moon Gyo Jung, Yong Hyun Lee, No Cheol Park, Hyun Seok Yang, Young Pil Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

L/UL (Load/Unload) dynamic characteristics are affected by various parameters, the friction between lift tap and ramp profiles and so on. Also, the L/UL speed is restricted and the power consumption is determined by these parameters. The mathematical governing equations are derived for four ramp step and suspension characteristics. And the experiment is carried out in order to verify L/UL dynamic characteristics when the lift tap moves along the ramp. As the results of simulation and experiment, the bias force of flex-cable is changed by ramp profile. In the case of this system, the flex cable pushes the actuator until step 3. But that pulls the actuator in step 4

Original languageEnglish
Title of host publicationAsia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages87-88
Number of pages2
ISBN (Electronic)0780387171, 9780780387171
DOIs
Publication statusPublished - 2004 Jan 1
Event2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004 - Seoul, Korea, Republic of
Duration: 2004 Aug 162004 Aug 19

Publication series

NameAsia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004

Other

Other2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004
CountryKorea, Republic of
CitySeoul
Period04/8/1604/8/19

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Park, K. S., Jung, M. G., Lee, Y. H., Park, N. C., Yang, H. S., & Park, Y. P. (2004). Analysis of L/UL characteristics using numerical model and measurement of lateral velocity profiles. In Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004 (pp. 87-88). [1521964] (Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APMRC.2004.1521964