Analysis of objective video quality metric using the wavelet transform

Chulhee Lee, Jihwan Choe, Wonseok Ahn, Taeuk Jeong, Sungdeuk Cho

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

In this paper, we investigate the performance of an objective video quality assessment method using the wavelet transform for a large data set. The objective video quality assessment utilizes the wavelet transform, which is applied to each frame of source and processed videos in order to compute spatial frequency components. Then, the difference (squared error) of the wavelet coefficients in each subband is computed and summed. By repeating this procedure to the entire frames of a video, a sequence of difference vectors and the average vector are obtained. Each component of the average vector represents a difference in a certain spatial frequency. In order to take into account the temporal frequencies, a modified 3-D wavelet transform can be applied. Although this evaluation method provides a good performance for training data, its performance for new test videos remains to be seen due to a large number of parameters. In this paper, we apply the method to a large video data set and analyze the performance.

Original languageEnglish
Pages (from-to)63-70
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5203
DOIs
Publication statusPublished - 2003 Dec 1
EventApplications of Digital Image Processing XXVI - San Diego, CA, United States
Duration: 2003 Aug 52003 Aug 8

Fingerprint

Video Quality
wavelet analysis
Wavelet transforms
Wavelet Transform
Metric
Quality Assessment
video data
Wavelet Coefficients
Evaluation Method
Large Data Sets
3D
education
Entire
evaluation
coefficients

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

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Analysis of objective video quality metric using the wavelet transform. / Lee, Chulhee; Choe, Jihwan; Ahn, Wonseok; Jeong, Taeuk; Cho, Sungdeuk.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 5203, 01.12.2003, p. 63-70.

Research output: Contribution to journalConference article

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