Analysis of self-heating effect on short channel amorphous ingazno thin-film transistors

Seok Woo Lee, Pyo Jin Jeon, Kyunghee Choi, Sung Wook Min, Hyeokjae Kwon, Seongil Im

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)


We report on a thin-flim transistor (TFT) degradation encountered in short channel amorphous indium-gallium-zinc-oxide TFTs under high applied power condition leading to self-heating. Negative shift was observed in the initial stage of stress period followed by positive shift with severe degradation. To understand the causes of this phenomenon in depth, trap density-of-states were measured by photo-excited charge-collection spectroscopy and time-dependent recovery of stressed device samples was also studied. As a result, we found that the combination of hot carrier effect and self-heating in channel was responsible for the degradation.

Original languageEnglish
Article number7057649
Pages (from-to)472-474
Number of pages3
JournalIEEE Electron Device Letters
Issue number5
Publication statusPublished - 2015 May 1

Bibliographical note

Publisher Copyright:
© 1980-2012 IEEE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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